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LMV115MG PDF预览

LMV115MG

更新时间: 2024-02-20 15:27:38
品牌 Logo 应用领域
美国国家半导体 - NSC 振荡器GSM
页数 文件大小 规格书
13页 473K
描述
GSM Baseband 30MHz 2.8V Oscillator Buffer

LMV115MG 技术参数

是否无铅:不含铅是否Rohs认证:符合
生命周期:Obsolete零件包装代码:SOIC
包装说明:TSSOP, TSSOP6,.08针数:6
Reach Compliance Code:compliantECCN代码:EAR99
HTS代码:8542.33.00.01风险等级:5.84
Is Samacsys:N放大器类型:BUFFER
标称带宽 (3dB):9 MHzJESD-30 代码:R-PDSO-G6
JESD-609代码:e3长度:2 mm
湿度敏感等级:1负供电电压上限:
标称负供电电压 (Vsup):功能数量:1
端子数量:6最高工作温度:85 °C
最低工作温度:-40 °C最小输出电流:0.1 A
封装主体材料:PLASTIC/EPOXY封装代码:TSSOP
封装等效代码:TSSOP6,.08封装形状:RECTANGULAR
封装形式:SMALL OUTLINE, THIN PROFILE, SHRINK PITCH峰值回流温度(摄氏度):260
电源:2.8 V认证状态:Not Qualified
座面最大高度:1.1 mm标称压摆率:18 V/us
子类别:Buffer Amplifiers最大压摆率:0.52 mA
供电电压上限:3.6 V标称供电电压 (Vsup):2.8 V
表面贴装:YES温度等级:INDUSTRIAL
端子面层:Matte Tin (Sn)端子形式:GULL WING
端子节距:0.65 mm端子位置:DUAL
处于峰值回流温度下的最长时间:40宽度:1.25 mm
Base Number Matches:1

LMV115MG 数据手册

 浏览型号LMV115MG的Datasheet PDF文件第1页浏览型号LMV115MG的Datasheet PDF文件第2页浏览型号LMV115MG的Datasheet PDF文件第4页浏览型号LMV115MG的Datasheet PDF文件第5页浏览型号LMV115MG的Datasheet PDF文件第6页浏览型号LMV115MG的Datasheet PDF文件第7页 
2.8V Electrical Characteristics (Continued)  
Unless otherwise specified, all limits guaranteed for TJ = 25˚C, V+ = 2.8V, V= 0V, VCM = V+/2, shutdown = 0.0V, and RL  
=
50kto V+/2, CL = 5pF to V+/2 and CCOUPLING = 1nF.Boldface limits apply at the temperature extremes.  
Min  
(Note 9)  
Typ  
(Note 8)  
2.38  
Max  
(Note 9)  
Symbol  
ZIN  
Parameter  
Input Impedance  
Conditions  
f = 25MHz; Shutdown = 2.8V  
f = 25MHz; Shutdown = 0V  
RL = 50kto V+/2  
Units  
kΩ  
2.47  
VO  
Output Swing Positive  
Output Swing Negative  
Linear Output Current  
1.90  
2.16  
1.05  
−206  
205  
1.65  
V
RL = 50kto V+/2  
1.35  
1.30  
IO  
No Load; VOUT = V+ − 1.1V  
(Sourcing)  
No Load; VOUT = V+ 1.1V  
−90  
−35  
100  
50  
µA  
(Sinking)  
ISC  
Output Short-Circuit Current  
(Note 5)  
No Load; Sourcing to V+/2  
−90  
−35  
100  
50  
−186  
191  
µA  
No Load; Sinking from V+/2  
RON  
Switch in ON Position  
40  
21  
45  
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is  
intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test conditions, see the Electrical Characteristics.  
Note 2: Human Body Model (HBM) is 1.5kin series with 100pF.  
Note 3: Machine Model, 0in series with 200pF.  
Note 4: Applies to both single-supply and split-supply operation. Continuous short circuit operation at elevated ambient temperature can result in exceeding the  
maximum allowed junction temperature of 150˚C  
Note 5: Infinite Duration; Short circuit test is a momentary test. See next note.  
Note 6: The maximum power dissipation is a function of T  
, θ , and T . The maximum allowable power dissipation at any ambient temperature is  
JA A  
J(MAX)  
P
= (T -T ) / θ . All numbers apply for packages soldered directly onto a PC board.  
J(MAX) A JA  
D
Note 7: Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of  
the device such that T = T . There is no guarantee of parametric performance as indicated in the electrical tables under conditions of internal self-heating where  
J
A
>
T
T . See Applications section for information on temperature de-rating of this device.  
J
A
Note 8: Typical Values represent the most likely parametric norm.  
Note 9: All limits are guaranteed by testing or statistical analysis.  
Note 10: Positive current corresponds to current flowing into the device.  
Note 11: Slew rate is the average of the positive and negative slew rate.  
Note 12: Average Temperature Coefficient is determined by dividing the change in a parameter at temperature extremes by the total temperature change.  
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