LM4951
www.ti.com
SNAS244N –AUGUST 2004–REVISED MAY 2013
LM4951
Wide Voltage Range 1.8 Watt Audio Amplifier
Check for Samples: LM4951
1
FEATURES
DESCRIPTION
The LM4951 is an audio power amplifier primarily
designed for demanding applications in Portable
Handheld devices. It is capable of delivering 1.8W
mono BTL to an 8Ω load, continuous average power,
with less than 1% distortion (THD+N) from a 7.5VDC
power supply.
2
•
Click and Pop Circuitry Eliminates Noise
during Turn-On and Turn-Off Transitions
•
•
•
•
•
Low Current, Active-Low Shutdown Mode
Low Quiescent Current
Thermal Shutdown Protection
Unity-Gain Stable
Boomer audio power amplifiers were designed
specifically to provide high quality output power with a
minimal amount of external components. The
LM4951 does not require bootstrap capacitors, or
snubber circuits.
External Gain Configuration Capability
APPLICATIONS
•
•
•
Portable Handheld Devices up to 9V
The LM4951 features a low-power consumption
active-low shutdown mode. Additionally, the LM4951
features an internal thermal shutdown protection
mechanism.
Cell Phone
PDA
KEY SPECIFICATIONS
The LM4951 contains advanced click and pop
circuitry that eliminates noises which would otherwise
occur during turn-on and turn-off transitions.
•
•
Wide Voltage Range: 2.7V to 9 V
Quiescent Power Supply Current (VDD
7.5V): 2.5mA (typ)
=
The LM4951 is unity-gain stable and can be
configured by external gain-setting resistors.
•
•
•
Power Output BTL at 7.5V, 1% THD: 1.8 W (typ)
Shutdown Current: 0.01µA (typ)
Fast Turn on Time: 25ms (typ)
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2004–2013, Texas Instruments Incorporated