LM2750
www.ti.com
SNVS180L –APRIL 2002–REVISED MAY 2013
LM2750 Low Noise Switched Capacitor Boost Regulator
Check for Samples: LM2750
1
FEATURES
APPLICATIONS
2
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•
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Inductorless Solution: Application Requires
Only 3 Small Ceramic Capacitors
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White and Colored LED-based Display
Lighting
Fixed 5.0V Output and Adjustable Output
Voltage Options Available
•
•
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Cellular Phone SIM Cards
Audio Amplifier Power Supplies
General Purpose Li-Ion-to-5V Conversion
85% Peak Efficiency
–
70% Average Efficiency over Li-Ion Input
Range (2.9V-to-4.2V)
DESCRIPTION
The LM2750 is
a regulated switched-capacitor
•
Output Current up to 120mA with 2.9V ≤ VIN ≤
5.6V
doubler that produces a low-noise output voltage. The
5.0V output voltage option (LM2750-5.0) can supply
up to 120mA of output current over a 2.9V to 5.6V
input range, as well as up to 40mA of output current
when the input voltage is as low as 2.7V. An
adjustable output voltage option with similar output
current capabilities is also available (LM2750-ADJ).
The LM2750 has been placed in TI's 10-pin WSON, a
package with excellent thermal properties that keeps
the part from overheating under almost all rated
operating conditions.
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Output Current up to 40mA with 2.7V ≤ VIN
2.9V
≤
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Wide Input Voltage Range: 2.7V to 5.6V
Fixed 1.7MHz Switching Frequency for a Low-
noise, Low-ripple Output Signal
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Pre-regulation Minimizes Input Current Ripple,
Keeping the Battery Line (VIN) Virtually Noise-
free
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Tiny WSON Package with Outstanding Power
Dissipation: Usually no Derating Required.
Shutdown Supply Current Less Than 2µA
Typical Application Circuit
IOUT up to 120mA, (VIN í 2.9V)
IOUT up to 40mA, (VIN í 2.7V)
8, 9
1, 2
VOUT
5.0V ± 4%
VOUT
VIN
VIN
2.7V to 5.6V
CIN
2.2 mF
COUT
2.2 mF
LM2750-5.0
10
7
4
CAP+
CAP-
SD
CFLY
1 mF
GND
3, 5, 6, DAP
Capacitors: 1.0mF - TDK C1608X5R1A105K
2.2mF - TDK C2012X7R1A225K
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2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2002–2013, Texas Instruments Incorporated