LM25184-Q1
ZHCSKZ5A – MARCH 2020 – REVISED AUGUST 2020
www.ti.com.cn
6 Specifications
6.1 Absolute Maximum Ratings
Over the recommended operating junction temperature range of –40°C to 150°C (unless otherwise noted)(1)
MIN
–0.3
–0.3
–0.3
–0.3
–0.3
–0.3
–0.3
–1.5
–3
MAX
UNIT
VIN to GND
45
EN/UVLO to GND
TC to GND
45
6
Input voltage
SS/BIAS to GND
FB to GND
14
V
45.3
0.3
3
FB to VIN
RSET to GND
SW to GND
70
Output voltage
V
SW to GND (20-ns transient)
Operating junction temperature, TJ
Storage temperature, Tstg
–40
–55
150
150
°C
°C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress
ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under
Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device
reliability.
6.2 ESD Ratings
VALUE
UNIT
Human body model (HBM), per AEC Q100-002
HBM ESD Classification Level 2 (1)
±2000
V(ESD)
Electrostatic discharge
All pins except 1, 4,
5, and 8
V
Charged device model (CDM), per
AEC Q100-011
CDM ESD Classification Level C4B
±500
±750
Pins 1, 4, 5, and 8
(1) AEC Q100-002 indicates HBM stressing is done in accordance with the ANSI/ESDA/JEDEC JS-001 specification.
6.3 Recommended Operating Conditions
Over the recommended operating junction temperature range of –40°C to 150°C (unless otherwise noted)
MIN
NOM
MAX
UNIT
V
VIN
Input voltage
4.5
42
VSW
SW voltage
65
V
VEN/UVLO
VSS/BIAS
TJ
EN/UVLO voltage
SS/BIAS voltage
Operating junction temperature
42
V
13
V
–40
150
°C
6.4 Thermal Information
LM25184-Q1
THERMAL METRIC(1)
NGU (WSON)
8 PINS
40.9
UNIT
RΘJA
Junction-to-ambient thermal resistance
Junction-to-case (top) thermal resistance
Junction-to-board thermal resistance
°C/W
°C/W
°C/W
°C/W
°C/W
°C/W
RΘJC(top)
RΘJB
36.9
17.7
ΨJT
Junction-to-top characterization parameter
Junction-to-board characterization parameter
Junction-to-case (bottom) thermal resistance
0.4
ΨJB
17.7
RΘJC(bot)
2.7
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics report.
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