Current Transducer LF 305-S
IPN = 300 A
For the electronic measurement of currents : DC, AC, pulsed...,
with a galvanic isolation between the primary circuit (high power)
and the secondary circuit (electronic circuit).
Preliminary
Electrical data
IPN
IP
RM
Primary nominal r.m.s. current
Primary current, measuring range
Measuring resistance
300
0 .. ± 500
RM min
A
A
Features
RMmax
· Closed loop (compensated) current
transducer using the Hall effect
· Insulated plastic case recognized
according to UL 94-V0.
with ± 12 V
with ± 15 V
with ± 20 V
@ ± 300 A max
0
0
0
0
15
15
39
12
58
22
93
45
W
W
W
W
W
W
@ ± 500 A max
@ ± 300 A max
@ ± 500 A max
@ ± 300 A max
@ ± 500 A max
Advantages
· Excellent accuracy
· Very good linearity
ISN
KN
VC
IC
Secondary nominal r.m.s. current
Conversion ratio
Supply voltage (± 5 %)
Current consumption
R.m.s. voltage for AC isolation test, 50 Hz, 1 mn
150
1 : 2000
± 12 .. 20
16 (@±20V) + IS mA
mA
· Low temperature drift
· Optimized response time
· Wide frequency bandwidth
· No insertion losses
· High immunity to external
interference
V
Vd
3
kV
Accuracy - Dynamic performance data
· Current overload capability.
X
Overall accuracy @ IPN , TA = 25°C
Linearity
± 0.4
< 0.1
%
%
eG
L
Applications
Typ Max
IO
IOM
IOT
Offset current @ IP = 0, TA = 25°C
± 0.20 mA
± 0.08 mA
± 0.1 ± 0.30 mA
· AC variable speed drives and servo
motor drives
· Static converters for DC motor drives
· Battery supplied applications
· Uninterruptible Power Supplies
(UPS)
Residual current1) @ IP = 0, after an overload of 3 x IPN
Thermal drift of IO
- 10°C .. + 70°C
tra
tr
Reaction time @ 10 % of IPN
Response time 2) @ 90 % of IPN
< 500
< 1
ns
µs
di/dt di/dt accurately followed
f
> 100
DC .. 100
A/µs
kHz
Frequency bandwidth (- 1 dB)
· Switched Mode Power Supplies
(SMPS)
General data
· Power supplies for welding
applications.
TA
TS
RS
m
Ambient operating temperature
Ambient storage temperature
Secondary coil resistance @ TA = 70°C
Mass
Standards 3)
- 10 .. + 70
- 25 .. + 85
28
95
EN 50178
°C
°C
W
g
1)
Notes : The result of the coercive field of the magnetic circuit
2)
With a di/dt of 100 A/µs
A list of corresponding tests is available
3)
991125/1
LEM Components
www.lem.com