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LD102A102FAB2A

更新时间： 2023-09-23 12:50:28
品牌 Logo 应用领域
京瓷/艾维克斯 - KYOCERA AVX /
页数 文件大小 规格书
14页 1033K
描述
SnPb Term MLCC

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LD102A102FAB2A 数据手册

 浏览型号LD102A102FAB2A的Datasheet PDF文件第3页浏览型号LD102A102FAB2A的Datasheet PDF文件第4页浏览型号LD102A102FAB2A的Datasheet PDF文件第5页浏览型号LD102A102FAB2A的Datasheet PDF文件第7页浏览型号LD102A102FAB2A的Datasheet PDF文件第8页浏览型号LD102A102FAB2A的Datasheet PDF文件第9页 
MLCC Tin/Lead Termination “B”  
X8R – Specifications and Test Methods  
Parameter/Test  
Operating Temperature Range  
Capacitance  
X8R Specification Limits  
-55ºC to +150ºC  
Within specified tolerance  
Measuring Conditions  
Temperature Cycle Chamber  
Freq.: 1.0 kHz ± 10%  
Voltage: 1.0Vrms ± .2V  
≤ 2.5% for ≥ 50V DC rating  
≤ 3.5% for 25V DC and 16V DC rating  
Dissipation Factor  
100,000MΩ or 1000MΩ - μF,  
Charge device with rated voltage for  
120 ± 5 secs @ room temp/humidity  
Insulation Resistance  
whichever is less  
Charge device with 250% of rated voltage for  
1-5 seconds, w/charge and discharge current  
limited to 50 mA (max)  
Note: Charge device with 150% of rated voltage  
for 500V devices.  
Dielectric Strength  
No breakdown or visual defects  
Appearance  
Capacitance  
Variation  
No defects  
Deflection: 2mm  
Test Time: 30 seconds  
≤ ±12%  
Resistance to  
Flexure  
Stresses  
Dissipation  
Factor  
Meets Initial Values (As Above)  
Insulation  
Resistance  
≥ Initial Value x 0.3  
≥ 95% of each terminal should be covered  
Dip device in eutectic solder at 230 ± 5ºC  
for 5.0 ± 0.5 seconds  
Solderability  
with fresh solder  
Appearance  
No defects, <25% leaching of either end terminal  
Capacitance  
Variation  
≤ ±7.5%  
Dip device in eutectic solder at 260ºC for 60  
seconds. Store at room temperature for 24 ± 2  
hours before measuring electrical properties.  
Dissipation  
Factor  
Insulation  
Resistance  
Resistance to  
Solder Heat  
Meets Initial Values (As Above)  
Meets Initial Values (As Above)  
Dielectric  
Strength  
Meets Initial Values (As Above)  
No visual defects  
≤ ±7.5%  
Appearance  
Step 1: -55ºC ± 2º  
30 ± 3 minutes  
Capacitance  
Variation  
Step 2: Room Temp  
≤ 3 minutes  
Dissipation  
Factor  
Meets Initial Values (As Above)  
Meets Initial Values (As Above)  
Step 3: +125ºC ± 2º  
Step 4: Room Temp  
30 ± 3 minutes  
Thermal Shock  
Insulation  
Resistance  
≤ 3 minutes  
Dielectric  
Strength  
Appearance  
Repeat for 5 cycles and measure after  
24 ± 2 hours at room temperature  
Meets Initial Values (As Above)  
No visual defects  
Capacitance  
Variation  
Dissipation  
Factor  
Insulation  
Resistance  
≤ ±12.5%  
Charge device with 1.5 rated voltage (≤ 10V) in  
test chamber set at 150ºC ± 2ºC  
for 1000 hours (+48, -0)  
≤ Initial Value x 2.0 (See Above)  
≥ Initial Value x 0.3 (See Above)  
Load Life  
Remove from test chamber and stabilize at room  
temperature for 24 ± 2 hours before measuring.  
Dielectric  
Strength  
Appearance  
Meets Initial Values (As Above)  
No visual defects  
Capacitance  
Variation  
Dissipation  
Factor  
Insulation  
Resistance  
Store in a test chamber set at 85ºC ± 2ºC/ 85% ±  
5% relative humidity for 1000 hours  
≤ ±12.5%  
(+48, -0) with rated voltage applied.  
≤ Initial Value x 2.0 (See Above)  
≥ Initial Value x 0.3 (See Above)  
Meets Initial Values (As Above)  
Load  
Humidity  
Remove from chamber and stabilize at room  
temperature and humidity for  
24 ± 2 hours before measuring.  
Dielectric  
Strength  
The Important Information/Disclaimer is incorporated in the catalog where these specifications came from or  
available online at www.avx.com/disclaimer/ by reference and should be reviewed in full before placing any order.  
44  
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