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K8S1115EZC-DE1ET PDF预览

K8S1115EZC-DE1ET

更新时间: 2023-06-15 00:00:00
品牌 Logo 应用领域
三星 - SAMSUNG 可编程只读存储器电动程控只读存储器电可擦编程只读存储器
页数 文件大小 规格书
83页 1511K
描述
EEPROM Card, 32MX16, 95ns, Parallel, CMOS, PBGA64,

K8S1115EZC-DE1ET 数据手册

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Rev. 1.1  
K8S1215E(T/B/Z)C  
datasheet NOR FLASH MEMORY  
512M Bit (32M x16) Muxed Burst / Multi Bank SLC NOR Flash Memory  
1.0 FEATURES  
2.0 GENERAL DESCRIPTION  
Single Voltage, 1.7V to 1.95V for Read and Write operations  
Organization  
The K8S(10/11/12/13)15E featuring single 1.8V power supply is a 512Mbit  
Muxed Burst Multi Bank Flash Memory organized as 32Mx16. The memory  
architecture of the device is designed to divide its memory arrays into  
512blocks(Uniform block part)/515 blocks (Boot block part) with indepen-  
dent hardware protection. This block architecture provides highly flexible  
erase and program capability. The K8S(10/11/12/13)15E NOR Flash con-  
sists of sixteen banks. This device is capable of reading data from one bank  
while programming or erasing in the other bank. Regarding read access  
time, the K8S10/1215E provides an 11ns burst access time and an 95ns  
initial access time at 66MHz. At 83MHz, the K8S10/1215E provides an 9ns  
burst access time and an 95ns initial access time. At 108MHz, the K8S11/  
1315E provides an 7ns burst access time and an 95ns initial access time.  
At 133MHz, the K8S11/1315E provides an 6ns burst access time and an  
95ns initial access time. The device performs a program operation in units  
of 16 bits (Word) and erases in units of a block. Single or multiple blocks  
can be erased. The block erase operation is completed within typically  
0.6sec. The device requires 25mA as program/erase current in the  
extended temperature ranges.  
- 33,554,432 x 16 bit (Word Mode Only)  
Multiplexed Data and Address for reduction of interconnections  
- A/DQ0 ~ A/DQ15  
Read While Program/Erase Operation  
Multiple Bank Architecture  
- 16 Banks (32Mb Partition)  
OTP Block : Extra 512-Word block  
Read Access Time (@ CL=30pF)  
- Asynchronous Random Access Time : 100ns  
- Synchronous Random Access Time : 95ns  
- Burst Access Time :  
11ns (66MHz) / 9ns (83MHz) / 7ns (108MHz) /6ns (133MHz)  
Burst Length :  
- Continuous Linear Burst  
- Linear Burst : 8-word & 16-word with Wrap  
Block Architecture  
- Uniform block part (K8S(10/11/12/13)15EZC) :  
Five hundred twelve 64Kword blocks  
- Boot block part (K8S(10/11/12/13)15ET(B)C) :  
Four 16Kword blocks and five hundred eleven 64Kword blocks (Bank 0  
contains four 16 Kword blocks and thirty-one 64Kword blocks, Bank 1 ~  
Bank 15 contain four hundred eighty 64Kword blocks)  
The K8S(10/11/12/13)15E NOR Flash Memory is created by using Sam-  
sung's advanced CMOS process technology.  
3.0 PIN DESCRIPTION  
Reduce program time using the VPP  
Support 512-word Buffer Program  
Pin Name  
Pin Function  
Power Consumption (Typical value, CL=30pF)  
- Synchronous Read Current : 35mA at 133MHz  
- Program/Erase Current : 25mA  
- Read While Program/Erase Current : 45mA  
- Standby Mode/Auto Sleep Mode : 30uA  
Block Protection/Unprotection  
A16 - A24  
Address Inputs  
A/DQ0 - A/DQ15  
Multiplexed Address/Data input/output  
Chip Enable  
CE  
OE  
Output Enable  
- Using the software command sequence  
- Last two boot blocks are protected by WP=VIL  
(Boot block part : K8S(10/11/12/13)15ET(B)C)  
- Last one block (BA511) is protected by WP=VIL  
(Uniform block part : K8S(10/11/12/13)15EZC)  
- All blocks are protected by VPP=VIL  
Handshaking Feature  
- Provides host system with minimum latency by monitoring RDY  
Erase Suspend/Resume  
Program Suspend/Resume  
Unlock Bypass Program/Erase  
RESET  
VPP  
Hardware Reset  
Accelerates Programming  
Write Enable  
WE  
WP  
Hardware Write Protection Input  
Clock  
CLK  
RDY  
AVD  
DPD  
Vcc  
Ready Output  
Address Valid Input  
Deep Power Down  
Power Supply  
Blank Check Feature  
Hardware Reset (RESET)  
Deep Power Down Mode  
Data Polling and Toggle Bits  
VSS  
Ground  
- Provides a software method of detecting the status of program  
or erase completion  
Endurance  
- 100K Program/Erase cycles  
Extended Temperature : -25°C ~ 85°C  
Support Common Flash Memory Interface  
Low Vcc Write Inhibit  
Output Driver Control by Configuration Register  
Package : 64Ball FBGA type (9mm x 11mm), 0.5mm ball pitch  
1.0mm(Max.)Thickness  
- 5 -  

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