INA821
www.ti.com.cn
ZHCSIM8C –AUGUST 2018–REVISED JULY 2019
7 Specifications
7.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)
MIN
–20
MAX
UNIT
Supply voltage
20
40
V
Voltage
–40
Signal input pins
REF pin
V
V
–20
20
Signal output pins
(-Vs) - 0.5
(+Vs) + 0.5
Output short-circuit(2)
Continuous
Operating Temperature, TA
Junction Temperature, TJ
Storage Temperature, Tstg
–50
150
175
150
°C
–65
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) Short-circuit to VS / 2.
7.2 ESD Ratings
VALUE
±1500
±750
UNIT
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)
Charged-device model (CDM), per JEDEC specification JESD22-C101(2)
V(ESD)
Electrostatic discharge
V
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
7.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
MIN
4.5
MAX
36
UNIT
Single-supply
Supply voltage VS
V
Dual-supply
±2.25
–40
±18
125
Specified temperature
Specified temperature
°C
7.4 Thermal Information
INA821
DGK (VSSOP)
THERMAL METRIC(1)
D (SOIC)
UNIT
8 PINS
119.6
66.3
8 PINS
215.4
66.3
RθJA
Junction-to-ambient thermal resistance
°C/W
°C/W
°C/W
°C/W
°C/W
°C/W
RθJC(top)
RθJB
Junction-to-case (top) thermal resistance
Junction-to-board thermal resistance
61.9
97.8
ψJT
Junction-to-top characterization parameter
Junction-to-board characterization parameter
Junction-to-case (bottom) thermal resistance
20.5
10.5
ψJB
61.4
96.1
RθJC(bot)
N/A
N/A
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
Copyright © 2018–2019, Texas Instruments Incorporated
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