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IBM0364404CT3C-10 PDF预览

IBM0364404CT3C-10

更新时间: 2024-01-22 19:34:45
品牌 Logo 应用领域
其他 - ETC 动态存储器
页数 文件大小 规格书
73页 857K
描述
x4 SDRAM

IBM0364404CT3C-10 数据手册

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IBM0364804 IBM0364164  
IBM0364404 IBM03644B4  
64Mb Synchronous DRAM - Die Revision C  
Features  
• Programmable Wrap: Sequential or Interleave  
• High Performance:  
-68 -75A, -260, -360, -10,  
CL=3 CL=3 CL=2 CL=3 CL=3  
• Multiple Burst Read with Single Write Option  
Units  
• Automatic and Controlled Precharge Command  
f
t
t
t
Clock Frequency  
Clock Cycle  
150 133 100 100 100 MHz  
CK  
CK  
• Data Mask for Read/Write control (x4, x8)  
• Dual Data Mask for byte control (x16)  
• Auto Refresh (CBR) and Self Refresh  
• Suspend Mode and Power Down Mode  
• Standard or Low Power operation  
• 4096 refresh cycles/64ms  
6.67 7.5  
10  
6
10  
6
10  
7
ns  
ns  
ns  
1
2
6
AC Clock Access Time  
AC Clock Access Time  
5.4  
9
1. Terminated load. See AC Characteristics on page 41.  
2. Unterminated load. See AC Characteristics on page 41.  
• Single Pulsed RAS Interface  
• Random Column Address every CLK (1-N Rule)  
• Single 3.3V ± 0.3V Power Supply  
LVTTL compatible  
• Fully Synchronous to Positive Clock Edge  
• Four Banks controlled by A12/A13 (Bank Select)  
• Programmable CAS Latency: 2, 3  
• Package: 54-pin 400 mil TSOP-Type II  
2 High Stack TSOJ  
• Programmable Burst Length: 1, 2, 4, 8, full-page  
Description  
The IBM0364404, IBM0364804, and IBM0364164  
are four-bank Synchronous DRAMs organized as  
4Mbit x 4 I/O x 4 Bank, 2Mbit x 8 I/O x 4 Bank, and  
1Mbit x 16 I/O x 4 Bank, respectively. IBM03644B4,  
a stacked version of the x4 component, is also  
offered. These synchronous devices achieve high-  
speed data transfer rates of up to 150MHz by  
employing a pipeline chip architecture that synchro-  
nizes the output data to a system clock. The chip is  
fabricated with IBM’s advanced 64Mbit single tran-  
sistor CMOS DRAM process technology.  
and two bank select addresses (A12, A13) are  
strobed with RAS. Ten column addresses (A0-A9)  
plus bank select addresses and A10 are strobed  
with CAS. Column address A9 is dropped on the x8  
device and column addresses A8 and A9 are  
dropped on the x16 device. Access to the lower or  
upper DRAM in a stacked device is controlled by  
CS0 and CS1, respectively.  
Prior to any access operation, the CAS latency,  
burst length, and burst sequence must be pro-  
grammed into the device by address inputs A0-A9  
during a mode register set cycle. In addition, it is  
possible to program a multiple burst sequence with  
single write cycle for write through cache operation.  
The device is designed to comply with all JEDEC  
standards set for synchronous DRAM products,  
both electrically and mechanically. All of the control,  
address, and data input/output (I/O or DQ) circuits  
are synchronized with the positive edge of an exter-  
nally supplied clock.  
Operating the four memory banks in an interleave  
fashion allows random access operation to occur at  
a higher rate than is possible with standard DRAMs.  
A sequential and gapless data rate of up to 150MHz  
is possible depending on burst length, CAS latency,  
and speed grade of the device. Simultaneous opera-  
tion of both decks of a stacked device is allowed,  
depending on the operation being done. Auto  
Refresh (CBR), Self Refresh, and Low Power opera-  
tion are supported.  
RAS, CAS, WE, and CS are pulsed signals which  
are examined at the positive edge of each externally  
applied clock (CLK). Internal chip operating modes  
are defined by combinations of these signals and a  
command decoder initiates the necessary timings  
for each operation. A fourteen bit address bus  
accepts address data in the conventional RAS/CAS  
multiplexing style. Twelve row addresses (A0-A11)  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
19L3265.E35856B  
01/00  
Page 1 of 73  

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