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GS81302S18E-250T PDF预览

GS81302S18E-250T

更新时间: 2024-02-21 22:04:29
品牌 Logo 应用领域
GSI 双倍数据速率静态存储器内存集成电路
页数 文件大小 规格书
35页 1322K
描述
DDR SRAM, 8MX18, 0.45ns, CMOS, PBGA165, 15 X 17 MM, 1 MM PITCH, MO-216CAB-1, FPBGA-165

GS81302S18E-250T 技术参数

是否无铅:含铅是否Rohs认证:不符合
生命周期:Not Recommended零件包装代码:BGA
包装说明:LBGA,针数:165
Reach Compliance Code:compliantECCN代码:3A991.B.2.B
HTS代码:8542.32.00.41风险等级:5.05
Is Samacsys:N最长访问时间:0.45 ns
其他特性:PIPELINED ARCHITECTUREJESD-30 代码:R-PBGA-B165
长度:17 mm内存密度:150994944 bit
内存集成电路类型:DDR SRAM内存宽度:18
功能数量:1端子数量:165
字数:8388608 words字数代码:8000000
工作模式:SYNCHRONOUS最高工作温度:70 °C
最低工作温度:组织:8MX18
封装主体材料:PLASTIC/EPOXY封装代码:LBGA
封装形状:RECTANGULAR封装形式:GRID ARRAY, LOW PROFILE
并行/串行:PARALLEL峰值回流温度(摄氏度):NOT SPECIFIED
认证状态:Not Qualified座面最大高度:1.5 mm
最大供电电压 (Vsup):1.9 V最小供电电压 (Vsup):1.7 V
标称供电电压 (Vsup):1.8 V表面贴装:YES
技术:CMOS温度等级:COMMERCIAL
端子形式:BALL端子节距:1 mm
端子位置:BOTTOM处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:15 mmBase Number Matches:1

GS81302S18E-250T 数据手册

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GS81302S08/09/18/36E-375/350/333/300/250  
Background  
Separate I/O SRAMs, like SigmaQuad SRAMs, are attractive in applications where alternating reads and writes are needed. On the  
other hand, Common I/O SRAMs like the SigmaCIO family are popular in applications where bursts of read or write traffic are  
needed. The SigmaSIO SRAM is a hybrid of these two devices. Like the SigmaQuad family devices, the SigmaSIO features a  
separate I/O data path, offering the user independent Data In and Data Out pins. However, the SigmaSIO devices offer a control  
protocol like that offered on the SigmaCIO devices. Therefore, while SigmaQuad SRAMs allow a user to operate both data ports at  
the same time, they force alternating loads of read and write addresses. SigmaSIO SRAMs allow continuous loads of read or write  
addresses like SigmaCIO SRAMs, but in a separate I/O configuration.  
Like a SigmaQuad SRAM, a SigmaSIO DDR-II SRAM can execute an alternating sequence of reads and writes. However, doing  
so results in the Data In port and the Data Out port stalling with nothing to do on alternate transfers. A SigmaQuad device would  
keep both ports running at capacity full time. On the other hand, the SigmaSIO device can accept a continuous stream of read  
commands and read data or a continuous stream of write commands and write data. The SigmaQuad device, by contrast, restricts  
the user from loading a continuous stream of read or write addresses. The advantage of the SigmaSIO device is that it allows twice  
the random address bandwidth for either reads or writes than could be acheived with a SigmaQuad version of the device.  
SigmaDDR (CIO) SRAMs offer this same advantage, but do not have the separate Data In and Data Out pins offered on the  
SigmaSIO SRAMs. Therefore, SigmaSIO devices are useful in psuedo dual port SRAM applications where communication of  
burst traffic between two electrically independent busses is desired.  
Each of the three SigmaQuad Family SRAMs—SigmaQuad, SigmaDDR, and SigmaSIO—supports similar address rates because  
random address rate is determined by the internal performance of the RAM. In addition, all three SigmaQuad Family SRAMs are  
based on the same internal circuits. Differences between the truth tables of the different devices proceed from differences in how  
the RAM’s interface is contrived to interact with the rest of the system. Each mode of operation has its own advantages and  
disadvantages. The user should consider the nature of the work to be done by the RAM to evaluate which version is best suited to  
the application at hand.  
Burst of 2 SigmaSIO DDR-II SRAM DDR Read  
The status of the Address Input, R/W, and LD pins are sampled at each rising edge of K. LD high causes chip disable. A high on  
the R/W pin begins a read cycle. The two resulting data output transfers begin after the next rising edge of the K clock. Data is  
clocked out by the next rising edge of the C if it is active. Otherwise, data is clocked out at the next rising edge of K. The next data  
chunk is clocked out on the rising edge of C, if active. Otherwise, data is clocked out on the rising edge of K.  
Burst of 2 SigmaSIO DDR-II SRAM DDR Write  
The status of the Address Input, R/W, and LD pins are sampled at each rising edge of K. LD high causes chip disable. A low on the  
R/W pin, begins a write cycle. Data is clocked in by the next rising edge of K and then the rising edge of K.  
Rev: 1.03b 12/2011  
7/35  
© 2011, GSI Technology  
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.  

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