Test Method
(Ref. Standard:JIS C 5101, IEC60384)
No
15
Item
Appearance No defects or abnormalities.
Specification
Solder the capacitor on the test substrate shown in Fig.3.
High
Temperature
High Humidity
(Steady)
Capacitance Within +/-7.5% or +/-0.75pF
Test Temperature
Test Humidity
Test Time
: 40+/-2℃
Change
(Whichever is larger)
: 90%RH to 95%RH
: 500+/-12h
Q
30pF and over:Q≧200
Applied Voltage
: DC Rated Voltage
30pF and below :Q≧100+10C/3
Charge/discharge current : 50mA max.
Exposure Time : 24+/-2h
C:Nominal Capacitance(pF)
I.R.
More than 500MΩ or 25Ω·F (Whichever is smaller)
16
Appearance No defects or abnormalities.
Capacitance Within +/-3% or +/-0.3pF
Solder the capacitor on the test substrate shown in Fig.3.
Durability
Test Temperature
Test Time
:
Max. Operating Temp. +/-3℃
Change
(Whichever is larger)
: 1000+/-12h
Applied Voltage
:
200% of the rated voltage
Q
30pF and over:Q≧350
Charge/discharge current : 50mA max.
Exposure Time 24+/-2h
10pF and over
:
30pF and below : Q≧275+5C/2
10pF and below : Q≧200+10C
C:Nominal Capacitance (pF)
I.R.
More than 1,000MΩ or 50Ω·F (Whichever is smaller)
Table A
Char.
Capacitance Change from 25C (%)
-55C
-30C
-10C
Max.
Min.
Max.
0.40
0.59
1.61
2.08
2.81
3.75
6.04
Min.
-0.17
-0.33
0.50
0.88
1.49
2.26
3.47
Max.
0.25
0.38
1.02
1.32
1.79
2.39
3.84
Min.
-0.11
-0.21
0.32
0.56
0.95
1.44
2.21
5C
6C
6P
6R
6S
6T
7U
0.58
0.87
2.33
3.02
4.09
5.46
8.78
-0.24
-0.48
0.72
1.28
2.16
3.28
5.04
JEMCGS-0015S
4