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GNM2145C1H680KD01 PDF预览

GNM2145C1H680KD01

更新时间: 2022-02-26 11:35:39
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村田 - MURATA /
页数 文件大小 规格书
24页 605K
描述
CHIP MONOLITHIC CERAMIC CAPACITOR

GNM2145C1H680KD01 数据手册

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SPECIFICATIONS AND TEST METHODS  
Specification  
No  
Item  
Test Method  
Temperature  
Compensating Type  
High Dielectric Type  
11 Vibration  
Appearance No defects or abnormalities.  
Solder the capacitor on the test jig (glass epoxy board) in  
the same manner and under the same conditions as (10).  
The capacitor should be subjected to a simple harmonic motion  
having a total amplitude of 1.5mm, the frequency being varied  
uniformly between the approximate limits of 10 and 55Hz. The  
frequency range, from 10 to 55Hz and return to 10Hz, should be  
traversed in approximately 1 minute. This motion should be  
applied for a period of 2 hours in each 3 mutually perpendicular  
directions(total of 6 hours).  
Resistance  
Capacitance Within the specified tolerance.  
Q/D.F.  
30pF and over:Q1000  
B1,R1,R6,R7]  
30pF and beloow:Q400+20C W.V.: 25Vmin. :0.025max.  
W.V.:16V  
W.V.:6.3V  
:0.035max.  
:0.05max.  
C:Nominal Capacitance(pF)  
[F1,F5]  
W.V.:25Vmin : 0.05max.  
W.V.:16V : 0.07max.  
12 Deflection  
Appearance No defects or abnormalities.  
Capacitance Within ±5% or± 0.5pF  
Solder the capacitor on the test jig (glass epoxy board) shown in  
Fig.1 using an eutectic solder. Then apply a force in the direction  
shown in Fig 2 for 5±1 seconds. The soldering should be done  
by the reflow method and should be conducted with care so that  
the soldering is uniform and free of defects such as heat shock.  
Within ±10%  
Change  
(Whichever is larger)  
13 Solderability  
75% of the terminations is to be soldered evenly and  
continuously.  
Immerse the capacitor in a solution of ethanol (JIS-K-8101) and  
rosin (JIS-K-5902) (25% rosin in weight propotion) .  
Preheat at 80 to 120for 10 to 30 seconds.  
of Termination  
After preheating , immerse in an eutectic solder solution for  
2±0.5 seconds at 230±5.  
14 Resistance to  
The measured and observed characteristics should satisfy Preheat the capacitor at 120 to 150for 1 minute.  
Soldering Heat  
the specifications in the following table.  
Immerse the capacitor in an eutectic solder solution at  
270±5for 10±0.5 seconds.  
Appearance No defects or abnormalities.  
Capacitance Within ±2.5% or± 0.25pF  
Let Sit at room temperature for 24±2 hours, then measure.  
B1,R1,R6,R7 :Within ±7.5%  
F1,F5 :Within ±20%  
B1,R1,R6,R7]  
Change  
Q/D.F.  
(Whichever is larger)  
· Initial measurement for high dielectric constant type  
Perform a heat treatment at 150+0/-10C for one hour and  
then set at room temperature for 24±2 hours.  
Perform the initial measurement.  
30pF and over:Q1000  
30pF and beloow:Q400+20C W.V.: 25Vmin. :0.025max.  
W.V.:16V  
W.V.:6.3V  
:0.035max.  
:0.05max.  
C:Nominal Capacitance(pF)  
[F1,F5]  
W.V.:25Vmin : 0.05max.  
W.V.:16V : 0.07max.  
I.R.  
More than 10,000MW or 500W·F(Whichever is smaller)  
Dielectric  
Strength  
No defects.  
15 Temperature Cycle  
The measured and observed characteristics should satisfy Fix the capacitor to the supporting jig in the same  
the specifications in the following table.  
manner and under the same conditions as (10).  
Perform the five cycles according to the four heat  
treatments shown in the following table.  
Appearance No defects or abnormalities.  
Set for 24±2 hours at room temperature, then measure.  
Capacitance Within ±2.5% or± 0.25pF  
B1,R1,R6,R7 :Within ±7.5%  
F1,F5 :Within ±20%  
B1,R1,R6,R7]  
Step  
1
Temp.(C)  
Time (min)  
30±3  
Change  
Q/D.F.  
(Whichever is larger)  
Min.  
Operating Temp.+0/-3  
30pF and over:Q1000  
Room Temp  
2
3
4
2 to 3  
30±3  
2 to 3  
30pF and beloow:Q400+20C W.V.: 25Vmin. :0.025max.  
Max.  
W.V.:16V  
W.V.:6.3V  
:0.035max.  
:0.05max.  
Operating Temp.+3/-0  
C:Nominal Capacitance(pF)  
Room Temp  
[F1,F5]  
W.V.:25Vmin : 0.05max.  
W.V.:16V : 0.07max.  
· Initial measurement for high dielectric constant type  
Perform a heat treatment at 150+0/-10C for one hour and  
then set at room temperature for 24±2 hours.  
Perform the initial measurement.  
I.R.  
More than 10,000MW or 500W·F(Whichever is smaller)  
Dielectric  
Strength  
No defects.  
JEMCCS-0001K  
3

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