■AEC-Q200 Murata Standard Specification and Test Methods
Specification.
No
AEC-Q200 Test Item
AEC-Q200 Test Method
High Dielectric Type
Temperature
Compensating Type
Pre-and Post-Stress
Electrical Test
1
2
-
High Temperature
Exposure (Storage)
The measured and observed characteristics should satisfy the
specifications in the following table.
Fix the capacitor to the test substrate in the same manner and
under the same conditions as No.16.
Appearance No marking defects
Set the capacitor for 1000+/-12hours at 150+/-3℃.
Set for 24+/-2hours at room temperature, then measure.
Capacitance Within +/-2.5% or +/-0.25pF
Within +/-12.5%
R7/L8 : 0.05 max.
・ Initial measurement for high dielectric constant type
Change
(Whichever is larger)
Perform a heat treatment at 150+0/-10 ℃ for 1hour and then sit
for 24+/-2hours at room temperature. Perform the initial measurement.
Q or D.F.
30pF min. : Q≧1000
30pF max.: Q ≧400+20C
C: Nominal Capacitance(pF)
R9
: 0.075 max.
I.R.
More than 10000MΩ or 500Ω・ F (Whichever is smaller)
R9 : More than 3000MΩ or 150 Ω・ F (Whichever is smaller)
25℃
3
Temperature Cycling
The measured and observed characteristics should satisfy the
specifications in the following table.
Fix the capacitor to the test substrate in the same manner and
under the same conditions as No.16. Perform the 1000 cycles
according to the four heat treatments listed in the following table.
Set for 24+/-2hours at room temperature, then measure.
Appearance No marking defects
Capacitance Within +/-2.5% or +/-0.25pF
Within +/-10.0%
Step
1
2
3
4
Change
(Whichever is larger)
Temp.
Min. Operating
Temp.+0/-3
Room
Max. Operating
Temp.+3/-0
Room
(℃)
Temp.
Temp.
Q or D.F.
30pF min. : Q≧1000
R7/L8 W.V.: 25Vmin.: 0.03 max.
ꢀꢀꢀꢀꢀW.V.: 16Vꢀꢀ : 0.05 max
R9 : 0.075 max.
30pF max.: Q ≧400+20C
C: Nominal Capacitance (pF)
Time
15+/-3
1
15+/-3
1
(min)
・ Initial measurement for high dielectric constant type
I.R.
More than 10000MΩ or 500Ω ・F
Perform a heat treatment at 150+0/-10 ℃ for 1hour and then sit
25℃
(Whichever is smaller)
for 24+/-2hours at room temperature. Perform the initial measurement.
4
5
Destructive
No defects or abnormalities
Per EIA-469.
Physical Analysis
Moisture Resistance
The measured and observed characteristics should satisfy the
specifications in the following table.
Fix the capacitor to the test substrate in the same manner and
under the same conditions as No.16.
Apply the 24-hour heat (25℃ to 65℃) and humidity (80%RH to 98%RH)
treatment shown below, 10 consecutive times.
Appearance No marking defects
Set for 24+/-2hours at room temperature, then measure.
Humidity
80～98%
Humidity
80～98%
Temperature
Humidity
90～98%
Humidity
90～98%
Humidity
90～98%
(℃)
70
65
60
55
50
45
40
35
30
25
20
15
10
5
Capacitance Within +/-3.0% or +/-0.30pF
Within +/-12.5%
R7/L8 : 0.05 max.
Change
(Whichever is larger)
Q or D.F.
30pF min. : Q≧350
10pF and over, 30pF and below:
Q≧275+5C/2
R9
: 0.075 max.
+10
2 ℃
-
10pF max.: Q ≧200+10C
C: Nominal Capacitance(pF)
Initial measuremt
0
-5
-10
I.R.
More than 10000MΩ or 500Ω・ F (Whichever is smaller)
R9 : More than 3000MΩ or 150 Ω・ F (Whichever is smaller)
One cycle 24hours
25℃
0
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15 16 17 18 19 20 21 22 23 24
Hours
・ Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10 ℃ for 1hour and then sit
for 24+/-2hours at room temperature. Perform the initial measurement.
6
The measured and observed characteristics should satisfy the
specifications in the following table.
Biased Humidity
Fix the capacitor to the test substrate in the same manner and
under the same conditions as No.16.
Apply the rated voltage and 1.3+0.2/-0Vdc (add 6.8kΩ resister)
Appearance No marking defects
at 85+/-3℃ and 80%RH to 85%RH humidity for 1000+/-12hours.
Remove and set for 24+/-2hours at room temperature, then measure.
The charge/discharge current is less than 50mA.
Capacitance Within +/-3.0% or +/-0.30pF
Within +/-12.5%
R7/L8 : 0.05 max.
Change
(Whichever is larger)
Q or D.F.
30pF and over: Q≧200
・ Initial measurement for high dielectric constant type
30pF and below: Q≧100+10C/3
C: Nominal Capacitance(pF)
More than 1000MΩ or 50Ω ・F
(Whichever is smaller)
R9
: 0.075 max.
Perform a heat treatment at 150+0/-10 ℃ for 1hour and then sit
for 24+/-2hours at room temperature. Perform the initial measurement.
I.R.
25℃
JEMCGS-06205
2
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