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FT18 PDF预览

FT18

更新时间: 2024-02-12 20:50:28
品牌 Logo 应用领域
恩智浦 - NXP 传感器图像传感器
页数 文件大小 规格书
16页 235K
描述
Frame Transfer CCD Image Sensor

FT18 技术参数

生命周期:ActiveReach Compliance Code:unknown
风险等级:5.56其他特性:SENSITIVITY IS 5.8 KEL/LUX, ELECTRONIC SHUTTER
阵列类型:FRAME TRANSFER主体宽度:15.49 mm
主体高度:4.53 mm主体长度或直径:29.7 mm
数据速率:40 Mbps动态范围:63.8 dB
水平像素:1024外壳:CERAMIC
安装特点:THROUGH HOLE MOUNT光学格式:2/3 inch
输出类型:ANALOG VOLTAGE封装形状/形式:RECTANGULAR
像素大小:7.5X7.5 µm传感器/换能器类型:IMAGE SENSOR,CCD
最大供电电压:24 V最小供电电压:16 V
表面贴装:NO端接类型:SOLDER
垂直像素:1024Base Number Matches:1

FT18 数据手册

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Philips Semiconductors  
Product specification  
Frame Transfer CCD Image Sensor  
FT 18  
Performance  
The performance of the FT 18 is described for modes of operation  
with 25 frames/sec or 30 frames/sec respectively. Measurements  
for the FT 18 are done under the following circumstances (values in  
brackets apply for the 30 frames/sec mode):  
• The vertical transport or frame shift frequency equals 750kHz  
(714kHz).  
• The horizontal transport or read-out frequency equals 36MHz  
(40MHz).  
• The RMS read-out noise of the output buffers and the FPN are  
measured in the bandwidth 0.1-18MHz (0.1-20MHz).  
• The performance in dark is given at a temperature of 318K / 45°C.  
Note that the dark current decreases by a factor of two for every  
decrease of temperature of approximately 10°C.  
• VNS is adjusted as low as possible while maintaining proper  
Vertical Anti-Blooming.  
• Integration takes place under 2 gates with 10V clock swing during  
40ms (33.33ms)  
Linear / Saturation  
Min.  
Typical  
Max.  
Unit  
Overexposure over entire area while maintaining good VAB  
Vertical resolution (MTF) @ 67 lp/mm  
Quantum efficiency @ 450 nm  
300  
25  
10  
21  
18  
5
-
-
lux  
%
-
-
11  
22  
19  
-
-
%
Quantum efficiency @ 520 nm  
-
%
Quantum efficiency @ 600 nm  
-
%
Quantum efficiency @ 800 nm (near IR)  
Image lag  
-
%
-
0
-
%
White Shading 1  
-
-
2.5  
%
Random Non-Uniformity (RNU) 2  
Full-well capacity Floating Diffusion (FD)  
Full-well capacity saturation level (Q max ) 3 image  
Full-well capacity saturation level (Q max ) storage  
Full-well capacity saturation level (Q max ) output register 4  
25 frames/sec mode only  
-
1.0  
-
1.4  
%
120  
40  
45  
90  
-
-
-
-
kel.  
kel.  
kel.  
kel.  
45  
-
-
5.6  
-
5.8  
-
-
kel/lux  
%
Sensitivity @ 3200K without IR cut-off filter  
Smear without shutter 5  
0.39  
-
60  
-
63.8  
29  
dB  
Dynamic range  
38  
el  
RMS read-out noise  
30 frames/sec mode only  
Sensitivity @ 3200K without IR cut-off filter  
Smear without shutter 5  
4.6  
-
4.8  
-
-
kel/lux  
%
0.40  
-
60  
-
63.5  
30  
dB  
Dynamic range  
40  
el  
RMS read-out noise  
1
White Shading is defined as the ratio of the one-σ value of an 8x8 pixel blurred image (low-pass) to the mean signal value.  
Random Non Uniformity is defined as the ratio of the one-σ value of the highpass image to the mean signal value at nominal light.  
2
3 Q max is determined from the lowpass filtered image.  
4 Q max of the output register may be increased up to 200kel. In this case the charge packets of the pixels may get mixed in the output register  
during horizontal transport. This may reduce the number of times that the output register needs to be read out if lines are read out solely to be  
dumped.  
5
The smear condition is: overexposure with a spot with a height of 10% of the image height (approx. 100 lines).  
2000 January  
8

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