Transfer Characteristics (T = -40°C to +85°C Unless otherwise specified.)
A
DC Characteristics
Test Conditions Symbol
Min
Typ**
Max
Unit
High Level Output Current
(I = 250 µA, V = 3.3 V, V = 3.3 V)
I
OH
50
µA
F
CC
O
(Note 2) V = 2.0 V
Single Channel
E
Low Level Output Voltage
Input Threshold Current
(V = 3.3 V, I = 5 mA, I = 13 mA)
V
0.6
5
V
CC
F
OL
OL
FT
(Note 2) V = 2.0 V
Single Channel
E
(V = 3.3 V, V = 0.6 V, I = 13 mA)
I
mA
CC
O
OL
(Note 2) V = 2.0 V
Single Channel
E
Isolation Characteristics (T = -40°C to +85°C Unless otherwise specified.)
A
Characteristics
Test Conditions Device Symbol
Min
Typ**
Max
Unit
Input-Output
Insulation Leakage Current
(Relative humidity = 45%)
(T = 25°C, t = 5 s)
I
1.0*
µA
I-O
A
(V = 3000 VDC)
I-O
(Note 12)
Withstand Insulation Test
Voltage
I
≤ 2 µA, R < 50%, FOD060L
V
3750
5000
V
RMS
IO
H
ISO
T = 25°C) FOD063L
A
(Note 12) ( t = 1 min.)
FOD260L
12
Resistance (Input to Output)
Capacitance (Input to Output)
(V = 500 V) (Note 12)
R
C
10
0.6
Ω
I-O
I-O
I-O
(f = 1 MHz) (Note 12)
pF
** All typical values are at V = 3.3 V, T = 25°C
CC
A
Notes
1. The V supply to each optoisolator must be bypassed by a 0.1µF capacitor or larger. This can be either a ceramic or solid
CC
tantalum capacitor with good high frequency characteristic and should be connected as close as possible to the package V and
CC
GND pins of each device.
2. Enable Input – No pull up resistor required as the device has an internal pull up resistor.
3.
4.
5.
t
– Propagation delay is measured from the 3.75 mA level on the HIGH to LOW transition of the input current pulse to the
PLH
1.5V level on the LOW to HIGH transition of the output voltage pulse.
t
level on the HIGH to LOW transition of the output voltage pulse.
t
– Propagation delay is measured from the 3.75 mA level on the LOW to HIGH transition of the input current pulse to the 1.5V
PHL
is the worst case difference between t and t for any devices at the stated test conditions.
PSK
PHL
PLH
6. t – Rise time is measured from the 90% to the 10% levels on the LOW to HIGH transition of the output pulse.
r
7. t – Fall time is measured from the 10% to the 90% levels on the HIGH to LOW transition of the output pulse.
f
8.
t
– Enable input propagation delay is measured from the 1.5V level on the HIGH to LOW transition of the input voltage pulse
ELH
to the 1.5V level on the LOW to HIGH transition of the output voltage pulse.
9.
t
– Enable input propagation delay is measured from the 1.5V level on the LOW to HIGH transition of the input voltage pulse
EHL
to the 1.5V level on the HIGH to LOW transition of the output voltage pulse.
10. CM – The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the high state (i.e.,
H
V
> 2.0 V). Measured in volts per microsecond (V/µs).
OUT
11. CM – The maximum tolerable rate of fall of the common mode voltage to ensure the output will remain in the low output state
L
(i.e., V
< 0.8 V). Measured in volts per microsecond (V/µs).
OUT
12. Device considered a two-terminal device: Pins 1,2,3 and 4 shorted together, and Pins 5,6,7 and 8 shorted together.
©2008 Fairchild Semiconductor Corporation
FOD060L, FOD260L, FOD063L Rev. 1.0.3
www.fairchildsemi.com
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