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FDA28N50F_12 PDF预览

FDA28N50F_12

更新时间: 2024-11-29 12:23:35
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飞兆/仙童 - FAIRCHILD /
页数 文件大小 规格书
8页 399K
描述
N-Channel MOSFET 500V, 28A, 0.175Ω

FDA28N50F_12 数据手册

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January 2012  
UniFETTM  
FDA28N50F  
N-Channel MOSFET  
500V, 28A, 0.175Ω  
Features  
Description  
RDS(on) = 0.140Ω ( Typ.)@ VGS = 10V, ID = 14A  
Low Gate Charge ( Typ. 80nC)  
Low Crss ( Typ. 38pF)  
These N-Channel enhancement mode power field effect  
transistors are produced using Fairchild’s proprietary, planar  
stripe, DMOS technology.  
This advance technology has been especially tailored to  
minimize on-state resistance, provide superior switching  
performance, and withstand high energy pulse in the avalanche  
and commutation mode. These device are well suited for high  
efficient switched mode power supplies and active power factor  
correction.  
Fast Switching  
100% Avalanche Tested  
Improved dv/dt Capability  
RoHS Compliant  
D
G
TO-3PN  
G D S  
S
MOSFET Maximum Ratings TC = 25oC unless otherwise noted  
Symbol  
VDSS  
VGSS  
Parameter  
Ratings  
500  
Units  
Drain to Source Voltage  
Gate to Source Voltage  
V
V
±30  
-Continuous (TC = 25oC)  
-Continuous (TC = 100oC)  
- Pulsed  
28  
ID  
Drain Current  
A
17  
IDM  
Drain Current  
(Note 1)  
(Note 2)  
(Note 1)  
(Note 1)  
(Note 3)  
112  
A
mJ  
A
EAS  
IAR  
Single Pulsed Avalanche Energy  
Avalanche Current  
2352  
28  
EAR  
dv/dt  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt  
31  
mJ  
V/ns  
W
W/oC  
oC  
20  
(TC = 25oC)  
- Derate above 25oC  
310  
PD  
Power Dissipation  
2.5  
TJ, TSTG  
TL  
Operating and Storage Temperature Range  
-55 to +150  
Maximum Lead Temperature for Soldering Purpose,  
1/8” from Case for 5 Seconds  
300  
oC  
Thermal Characteristics  
Symbol  
Parameter  
Thermal Resistance, Junction to Case  
Thermal Resistance, Case to Sink Typ.  
Thermal Resistance, Junction to Ambient  
Ratings  
0.4  
Units  
RθJC  
RθCS  
RθJA  
0.24  
40  
oC/W  
©2012 Fairchild Semiconductor Corporation  
FDA28N50F Rev.C0  
1
www.fairchildsemi.com