Datasheet > ESD7554MUT2G

ESD7554MUT2G

更新时间： 2024-09-29 01:22:43

品牌	Logo	应用领域
安森美 - ONSEMI		/
页数	文件大小	规格书
7页	230K
描述
4Channel DualVoltage Protection Array

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中文翻译

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ESD7554MUT2G 数据手册

ESD7554

4Channel Low Capacitance

DualVoltage ESD

Protection Array

Features

http://onsemi.com

MARKING

• 3 Channels of Low Voltage ESD Protection

• 1 Channel of High Voltage ESD Protection

• Provides ESD Protection to IEC61000−4−2 Level 4:

DIAGRAM

8 kV Contact Discharge (Pins 1−3)

15 kV Contact Discharge (Pin 4)

30V MG

• Low Channel Input Capacitance

• Minimal Capacitance Change with Temperature and Voltage

• High Voltage Zener Diode Protects Supply Rail

• No Need for External Bypass Capacitors

WDFN8

CASE 517BC

• Each I/O Pin Can Withstand Over 1000 ESD Strikes*

30V = Specific Device Code

= Date Code

= Pb−Free Package

• These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS

Compliant

PINOUT

DAP

Bottom View

(Pins up View)

ORDERING INFORMATION

See detailed ordering and shipping information in the package

dimensions section on page 2 of this data sheet.

NOTE: Note: Pins 5, and 6 to 8 are connected to a common

substrate.

Figure 1. Electrical Schematic

*Standard test condition is IEC61000−4−2 level 4 test circuit with each pin subjected to 8 kV contact discharge for 1000 pulses. Discharges

are timed at 1 second intervals and all 1000 strikes are completed in one continuous test run. The part is then subjected to standard production

test to verify that all of the tested parameters are within spec after the 1000 strikes.

Publication Order Number:

November, 2010 − Rev. 0

ESD7554/D

12 3 4 5 6 7

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