EN29F512-55SC PDF预览

EN29F512-55SC

更新时间: 2025-07-28 06:57:15
品牌 Logo 应用领域
EON 闪存存储内存集成电路光电二极管
页数 文件大小 规格书
35页 427K
描述
512 Kbit (64K x 8-bit) 5V Flash Memory

EN29F512-55SC 技术参数

是否Rohs认证: 不符合生命周期:Transferred
包装说明:TSOP1, TSSOP32,.56,20Reach Compliance Code:unknown
风险等级:5.72Is Samacsys:N
最长访问时间:55 ns命令用户界面:YES
数据轮询:YESJESD-30 代码:R-PDSO-G32
JESD-609代码:e0内存密度:524288 bit
内存集成电路类型:FLASH内存宽度:8
功能数量:1部门数/规模:4
端子数量:32字数:65536 words
字数代码:64000工作模式:ASYNCHRONOUS
最高工作温度:70 °C最低工作温度:
组织:64KX8封装主体材料:PLASTIC/EPOXY
封装代码:TSOP1封装等效代码:TSSOP32,.56,20
封装形状:RECTANGULAR封装形式:SMALL OUTLINE, THIN PROFILE
并行/串行:PARALLEL电源:5 V
编程电压:5 V认证状态:Not Qualified
部门规模:16K最大待机电流:0.000005 A
子类别:Flash Memories最大压摆率:0.03 mA
最大供电电压 (Vsup):5.25 V最小供电电压 (Vsup):4.75 V
标称供电电压 (Vsup):5 V表面贴装:YES
技术:CMOS温度等级:COMMERCIAL
端子面层:Tin/Lead (Sn/Pb)端子形式:GULL WING
端子节距:0.5 mm端子位置:DUAL
切换位:YES类型:NOR TYPE
Base Number Matches:1

EN29F512-55SC 数据手册

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EN29F512  
EN29F512  
512 Kbit (64K x 8-bit) 5V Flash Memory  
FEATURES  
JEDEC Standard program and erase  
5.0V operation for read/write/erase  
commands  
operations  
JEDEC standard  
polling and toggle  
DATA  
Fast Read Access Time  
bits feature  
- 45ns, 55ns, 70ns, and 90ns  
Single Sector and Chip Erase  
Sector Unprotect Mode  
Sector Architecture:  
- 4 uniform sectors of 16Kbytes each  
- Supports full chip erase  
Embedded Erase and Program Algorithms  
- Individual sector erase supported  
- Sector protection:  
Erase Suspend / Resume modes:  
Read and program another Sector during  
Erase Suspend Mode  
Hardware locking of sectors to prevent  
program or erase operations within  
individual sectors  
0.23 µm triple-metal double-poly  
triple-well CMOS Flash Technology  
High performance program/erase speed  
- Byte program time: 7µs typical  
- Sector erase time: 300ms typical  
- Chip erase time: 1.5s typical  
Low Vcc write inhibit < 3.2V  
100K endurance cycle  
Package Options  
Low Standby Current  
- 32-pin PDIP  
- 1µA CMOS standby current-typical  
- 1mA TTL standby current  
- 32-pin PLCC  
Low Power Active Current  
- 32-pin 8mm x 20mm TSOP (Type 1)  
- 32-pin 8mm x 14mm TSOP (Type 1)  
- 12mA typical active read current  
- 30mA program/erase current  
Commercial and Industrial Temperature  
Ranges  
GENERAL DESCRIPTION  
The EN29F512 is a 512-Kbit, electrically erasable, read/write non-volatile flash memory. Organized  
into 64K bytes with 8 bits per byte, the 512K of memory is arranged in four uniform sectors of  
16Kbytes each. Any byte can be programmed typically in 7µs. The EN29F512 features 5.0V  
voltage read and write operation, with access times as fast as 45ns to eliminate the need for WAIT  
states in high-performance microprocessor systems.  
The EN29F512 has separate Output Enable (  
), Chip Enable (  
), and Write Enable (  
)
W E  
OE  
CE  
controls, which eliminate bus contention issues. This device is designed to allow either single  
Sector or full chip erase operation, where each Sector can be individually protected against  
program/erase operations or temporarily unprotected to erase or program. The device can sustain a  
minimum of 100K program/erase cycles on each Sector.  
This Data Sheet may be revised by subsequent versions  
©2003 Eon Silicon Solution, Inc., www.essi.com.tw  
Rev. A, Issue Date: 2003/10/20  
1
or modifications due to changes in technical specifications.  

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