EN29F002AT-90PCP PDF预览

EN29F002AT-90PCP

更新时间: 2025-07-28 06:57:15
品牌 Logo 应用领域
EON 闪存存储内存集成电路光电二极管
页数 文件大小 规格书
35页 430K
描述
2 Megabit (256K x 8-bit) Flash Memory

EN29F002AT-90PCP 技术参数

是否Rohs认证: 符合生命周期:Obsolete
包装说明:DIP, DIP32,.6Reach Compliance Code:unknown
风险等级:5.84最长访问时间:90 ns
启动块:TOP命令用户界面:YES
数据轮询:YES耐久性:100000 Write/Erase Cycles
JESD-30 代码:R-PDIP-T32内存密度:2097152 bit
内存集成电路类型:FLASH内存宽度:8
部门数/规模:1,2,1,3端子数量:32
字数:262144 words字数代码:256000
最高工作温度:70 °C最低工作温度:
组织:256KX8封装主体材料:PLASTIC/EPOXY
封装代码:DIP封装等效代码:DIP32,.6
封装形状:RECTANGULAR封装形式:IN-LINE
并行/串行:PARALLEL电源:5 V
认证状态:Not Qualified部门规模:16K,8K,32K,64K
最大待机电流:0.000005 A子类别:Flash Memories
最大压摆率:0.03 mA标称供电电压 (Vsup):5 V
表面贴装:NO技术:CMOS
温度等级:COMMERCIAL端子形式:THROUGH-HOLE
端子节距:2.54 mm端子位置:DUAL
切换位:YES类型:NOR TYPE
Base Number Matches:1

EN29F002AT-90PCP 数据手册

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EN29F002A / EN29F002AN  
EN29F002A / EN29F002AN  
2 Megabit (256K x 8-bit) Flash Memory  
FEATURES  
5.0V ± 10% for both read/write operation  
JEDEC standard  
polling and toggle  
DATA  
bits feature  
Hardware  
Read Access Time  
Pin (n/a on EN29F002AN)  
RESET  
- 45ns, 55ns, 70ns, and 90ns  
Single Sector and Chip Erase  
Fast Read Access Time  
- 70ns with Cload = 100pF  
- 45ns, 55ns with Cload = 30pF  
Sector Protection / Temporary Sector  
Unprotect (  
= VID)  
RESET  
Sector Architecture:  
Sector Unprotect Mode  
One 16K byte Boot Sector, Two 8K byte  
Parameter Sectors, one 32K byte and  
three 64K byte main Sectors  
Embedded Erase and Program Algorithms  
Erase Suspend / Resume modes:  
Read and program another sector during  
Erase Suspend Mode  
Boot Block Top/Bottom Programming  
Architecture  
0.23 µm triple-metal double-poly  
High performance program/erase speed  
- Byte program time: 10µs typical  
- Sector erase time: 500ms typical  
- Chip erase time: 3.5s typical  
triple-well CMOS Flash Technology  
Low Vcc write inhibit < 3.2V  
100K endurance cycle  
Package Options  
- 32-pin PDIP  
Low Standby Current  
- 1µA CMOS standby current-typical  
- 1mA TTL standby current  
- 32-pin PLCC  
Low Power Active Current  
- 30mA active read current  
- 30mA program / erase current  
- 32-pin TSOP (Type 1)  
Commercial and Industrial Temperature  
Ranges  
JEDEC Standard program and erase  
commands  
GENERAL DESCRIPTION  
The EN29F002A / EN29F002AN is a 2-Megabit, electrically erasable, read/write non-volatile flash memory.  
Organized into 256K words with 8 bits per word, the 2M of memory is arranged in seven sectors (with  
top/bottom configuration), including one 16K Byte Boot Sector, two 8K Byte Parameter sectors, and four main  
sectors (one 32K Byte and three 64K Byte). Any byte can be programmed typically at 10µs. The EN29F002A /  
EN29F002AN features 5.0V voltage read and write operation. The access times are as fast as 45ns to  
eliminate the need for WAIT states in high-performance microprocessor systems.  
The EN29F002A / EN29F002AN has separate Output Enable (  
), Chip Enable (  
), and Write  
CE  
OE  
Enable (  
) controls which eliminate bus contention issues. This device is designed to allow  
W E  
either single sector or full chip erase operation, where each sector can be individually protected  
against program/erase operations or temporarily unprotected to erase or program. The device can  
sustain  
a
minimum  
of  
100K  
program/erase  
cycles  
on  
each  
sector.  
This Data Sheet may be revised by subsequent versions  
©2003 Eon Silicon Solution, Inc., www.essi.com.tw  
Rev. A, Issue Date: 2003/03/26  
1
or modifications due to changes in technical specifications.  

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