Aluminium Electrolytic Capacitors/SU
( Radial Lead Type)
Discontinued
Series: SU
Type: A
■ Features Life time:85°C 2000h
■Specifications
Operating Temp. Range
Rated W.V. Range
-40 to +85°C
6.3 to 100V.DC
0.1 to 15000 µF
-25 to +85°C
160 to 450V.DC
0.47 to 220 µF
Nominal Cap. Range
Capacitance Tolerance
20% (120Hz/+20°C)
I <0.03 CV or 4 ( µA) after 1 minutes
DC Leakage Current
I <0.06 CV + 10 ( µA) after 2 minutes
I <0.01 CV or 3 ( µA) after 2 minutes
( Whichever is the greater )
W.V. (V)
tan δ
6.3 10 16 25 35 50 63 100 160 200 250 350 400 450
0.22 0.19 0.16 0.14 0.12 0.10 0.09 0.08 0.16 0.18 0.18 0.20 0.20 0.20
tan δ
Add 0.02 per 1000 µF for products of 1000 µF or more. (120 Hz/+20°C )
W.V. (V)
6.3 10 16
25 35 50 63 100 160 200 250 350 400 450
4
8
3
6
2
4
2
4
2
3
2
3
2
3
2
3
2
-
2
-
3
-
5
-
15 15
Z(-25°C)/Z(+20°C)
Z(-40°C)/Z(+20°C)
Characteristics at
Low Temperature
-
-
1.Add 0.5 per 1000 µF for products of 1000 µF or more.
2.Add 1.0 per 1000 µF for products of 1000 µF or more.
(Impedance ratio at 120Hz)
After applying rated working voltage for 2000 hours at +85°C and then being stabilized at +20°C,
capacitor shall meet the following limits.
Capacitance change
tan δ
±20% of initial measured value
<150% of initial specified value
< lnitial specified value
Endurance
Shelf Line
DC leakage current
After storage for 1000 hours at +85°C with no voltage applied and then being
stabilized at +20°C, capacitor shall meet the limits specified in -Endurance-.
■ Explanation of Part Number
E
C
E
A
U
Common code
Shape
W.V. code
Series
Capacitance code
Suffix
■ Dimensions in mm (not to scale)
P.V.C. Sleeve
φ8>
φ10<
φd±0.05
(>6.3mmdia)
Vent
L
L <16:L+1.0max
L >20:L+2.0 max
14min
3min
φD+0.5 max.
φD+0.5 max.
Body Dia. φD
Lead Dia. φd
Lead space P
5
6.3
0.5
8
10
12.5
0.6
16
18
0.5
0.6
3.5
0.6
0.8
0.8
2
2.5
5
5
7.5
7.5
Design, Specifications are subject to change without notice. Ask factory for technical specifications before purchase and/or use.
Whenever a doubt about safety arises from this product, please inform us immediately for technical consulation without fail.
Mar. 2005
Ñ EE1 Ñ