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DM54LS279W/883 PDF预览

DM54LS279W/883

更新时间: 2024-10-01 21:12:07
品牌 Logo 应用领域
美国国家半导体 - NSC 输入元件输出元件逻辑集成电路触发器
页数 文件大小 规格书
6页 13K
描述
IC LS SERIES, QUAD LOW LEVEL TRIGGERED R-S LATCH, TRUE OUTPUT, CDFP16, DFP-16, FF/Latch

DM54LS279W/883 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
包装说明:DFP, FL16,.3Reach Compliance Code:unknown
HTS代码:8542.39.00.01风险等级:5.16
其他特性:WITH DUAL S INPUT FOR TWO FUNCTIONS系列:LS
JESD-30 代码:R-GDFP-F16JESD-609代码:e0
长度:9.6645 mm逻辑集成电路类型:R-S LATCH
最大I(ol):0.004 A位数:2
功能数量:4端子数量:16
最高工作温度:125 °C最低工作温度:-55 °C
输出极性:TRUE封装主体材料:CERAMIC, GLASS-SEALED
封装代码:DFP封装等效代码:FL16,.3
封装形状:RECTANGULAR封装形式:FLATPACK
峰值回流温度(摄氏度):NOT SPECIFIED电源:5 V
最大电源电流(ICC):7 mAProp。Delay @ Nom-Sup:27 ns
传播延迟(tpd):42 ns认证状态:Not Qualified
筛选级别:MIL-STD-883座面最大高度:2.032 mm
子类别:FF/Latches最大供电电压 (Vsup):5.5 V
最小供电电压 (Vsup):4.5 V标称供电电压 (Vsup):5 V
表面贴装:YES技术:TTL
温度等级:MILITARY端子面层:Tin/Lead (Sn/Pb)
端子形式:FLAT端子节距:1.27 mm
端子位置:DUAL处于峰值回流温度下的最长时间:NOT SPECIFIED
触发器类型:LOW LEVEL宽度:6.604 mm
Base Number Matches:1

DM54LS279W/883 数据手册

 浏览型号DM54LS279W/883的Datasheet PDF文件第2页浏览型号DM54LS279W/883的Datasheet PDF文件第3页浏览型号DM54LS279W/883的Datasheet PDF文件第4页浏览型号DM54LS279W/883的Datasheet PDF文件第5页浏览型号DM54LS279W/883的Datasheet PDF文件第6页 
MICROCIRCUIT DATA SHEET  
Original Creation Date: 04/13/98  
Last Update Date: 07/17/98  
MNDM54LS279-X REV 1A0  
Last Major Revision Date: 04/13/98  
QUAD SET-RESET LATCH  
General Description  
The 'LS279 consists of four individual and independent Set-Reset Latches with active low  
inputs. Two of the four latches have an additional S input ANDed with the primary  
S input. A low on any S input while the R input is high will be stored in the latch and  
appear on the corresponding Q output as a high. A low on the R input while the S input is  
high will clear the Q output to a low. Simultaneous transition of the R and S inputs from  
low to high will cause the Q output to be indeterminate. Both inputs are voltage level  
triggered and are not affected by transition time on the input data.  
Industry Part Number  
NS Part Numbers  
54LS279  
DM54LS279J/883  
DM54LS279W/883  
Prime Die  
L279  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25  
2
Static tests at  
+125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
+25  
Quality Conformance Inspection  
5
+125  
-55  
6
MIL-STD-883, Method 5005  
7
+25  
8A  
8B  
9
+125  
-55  
+25  
10  
11  
+125  
-55  
1

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