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CY7C1143V18-333BZC PDF预览

CY7C1143V18-333BZC

更新时间: 2024-11-07 05:17:07
品牌 Logo 应用领域
赛普拉斯 - CYPRESS 时钟静态存储器内存集成电路
页数 文件大小 规格书
28页 620K
描述
QDR SRAM, 1MX18, 0.45ns, CMOS, PBGA165, 13 X 15 MM, 1.40 MM HEIGHT, MO-216, FPBGA-165

CY7C1143V18-333BZC 技术参数

是否无铅: 含铅是否Rohs认证: 不符合
生命周期:Obsolete零件包装代码:BGA
包装说明:13 X 15 MM, 1.40 MM HEIGHT, MO-216, FPBGA-165针数:165
Reach Compliance Code:compliantECCN代码:3A991.B.2.A
HTS代码:8542.32.00.41风险等级:5.92
最长访问时间:0.45 ns其他特性:PIPELINED ARCHITECTURE
最大时钟频率 (fCLK):333 MHzI/O 类型:SEPARATE
JESD-30 代码:R-PBGA-B165JESD-609代码:e0
长度:15 mm内存密度:18874368 bit
内存集成电路类型:QDR SRAM内存宽度:18
湿度敏感等级:3功能数量:1
端子数量:165字数:1048576 words
字数代码:1000000工作模式:SYNCHRONOUS
最高工作温度:70 °C最低工作温度:
组织:1MX18输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:LBGA
封装等效代码:BGA165,11X15,40封装形状:RECTANGULAR
封装形式:GRID ARRAY, LOW PROFILE并行/串行:PARALLEL
峰值回流温度(摄氏度):220电源:1.5/1.8,1.8 V
认证状态:Not Qualified座面最大高度:1.4 mm
最大待机电流:0.212 A最小待机电流:1.7 V
子类别:SRAMs最大压摆率:0.708 mA
最大供电电压 (Vsup):1.9 V最小供电电压 (Vsup):1.7 V
标称供电电压 (Vsup):1.8 V表面贴装:YES
技术:CMOS温度等级:COMMERCIAL
端子面层:TIN LEAD端子形式:BALL
端子节距:1 mm端子位置:BOTTOM
处于峰值回流温度下的最长时间:NOT SPECIFIED宽度:13 mm
Base Number Matches:1

CY7C1143V18-333BZC 数据手册

 浏览型号CY7C1143V18-333BZC的Datasheet PDF文件第2页浏览型号CY7C1143V18-333BZC的Datasheet PDF文件第3页浏览型号CY7C1143V18-333BZC的Datasheet PDF文件第4页浏览型号CY7C1143V18-333BZC的Datasheet PDF文件第5页浏览型号CY7C1143V18-333BZC的Datasheet PDF文件第6页浏览型号CY7C1143V18-333BZC的Datasheet PDF文件第7页 
CY7C1141V18, CY7C1156V18  
CY7C1143V18, CY7C1145V18  
18-Mbit QDR™-II+ SRAM 4-Word Burst  
Architecture (2.0 Cycle Read Latency)  
Features  
Functional Description  
Separate Independent read and write data ports  
Supports concurrent transactions  
300 MHz to 375 MHz clock for high bandwidth  
The CY7C1141V18, CY7C1156V18, CY7C1143V18, and  
CY7C1145V18 are 1.8V Synchronous Pipelined SRAMs,  
equipped with QDR™-II+ architecture. QDR-II+ architecture  
consists of two separate ports to access the memory array. The  
read port has dedicated data outputs to support read operations  
and the write port has dedicated data inputs to support write  
operations. QDR-II+ architecture has separate data inputs and  
data outputs to completely eliminate the need to “turn-around”  
the data bus required with common IO devices. Access to each  
4-Word Burst for reducing address bus frequency  
DoubleDataRate(DDR)interfacesonbothreadandwriteports  
(data transferred at 750 MHz) at 375 MHz  
Read latency of 2.0 clock cycles  
Two input clocks (K and K) for precise DDR timing  
SRAM uses rising edges only  
Echo clocks (CQ and CQ) simplify data capture in high speed  
port is accomplished through  
a common address bus.  
Addresses for read and write addresses are latched on alternate  
rising edges of the input (K) clock. Accesses to the QDR-II+ read  
and write ports are completely independent of one another. To  
maximize data throughput, both read and write ports are  
equipped with Double Data Rate (DDR) interfaces. Each  
address location is associated with four 8-bit words  
(CY7C1141V18), or 9-bit words (CY7C1156V18), or 18-bit words  
(CY7C1143V18), or 36-bit words (CY7C1145V18) that burst  
sequentially into or out of the device. Because data can be trans-  
ferred into and out of the device on every rising edge of both input  
clocks K and K, memory bandwidth is maximized while simpli-  
fying system design by eliminating bus “turn-arounds”.  
systems  
Single multiplexed address input bus latches address inputs  
for both read and write ports  
Separate Port Selects for depth expansion  
Data valid pin (QVLD) to indicate valid data on the output  
Synchronous internally self-timed writes  
Available in x8, x9, x18, and x36 configurations  
Full data coherency providing most current data  
[1]  
Core VDD = 1.8V ± 0.1V; IO VDDQ = 1.4V to VDD  
Depth expansion is accomplished with Port Selects for each port.  
Port Selects enable each port to operate independently.  
Available in 165-Ball FBGA package (13 x 15 x 1.4 mm)  
Offered in both Pb-free and non Pb-free packages  
Variable drive HSTL output buffers  
All synchronous inputs pass through input registers controlled by  
the K or K input clocks. All data outputs pass through output  
registers controlled by the K or K input clocks. Writes are  
conducted with on-chip synchronous self-timed write circuitry.  
JTAG 1149.1 compatible test access port  
Delay Lock Loop (DLL) for accurate data placement  
Configurations  
With Read Cycle Latency of 2.0 cycles:  
CY7C1141V18 – 2M x 8  
CY7C1156V18 – 2M x 9  
CY7C1143V18 – 1M x 18  
CY7C1145V18 – 512K x 36  
Selection Guide  
Description  
Maximum Operating Frequency  
Maximum Operating Current  
375 MHz  
375  
333 MHz  
333  
300 MHz  
300  
Unit  
MHz  
mA  
1020  
920  
850  
Note  
1. The QDR consortium specification for VDDQ is 1.5V + 0.1V. The Cypress QDR devices exceed the QDR consortium specification and are capable of supporting VDDQ  
= 1.4V to VDD  
.
Cypress Semiconductor Corporation  
Document Number: 001-06583 Rev. *D  
198 Champion Court  
San Jose, CA 95134-1709  
408-943-2600  
Revised March 06, 2008  
[+] Feedback  

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