CY74FCT16501T
CY74FCT162501T
CY74FCT162H501T
Electrical Characteristics Over the Operating Range
Parameter
Description
Input HIGH Voltage
Test Conditions
Min.
Typ.[8]
Max.
Unit
V
VIH
VIL
VH
VIK
IIH
2.0
Input LOW Voltage
Input Hysteresis[9]
0.8
V
100
mV
V
Input Clamp Diode Voltage
Input HIGH Current
VCC=Min., IIN=−18 mA
Standard VCC=Max., VI=VCC
Bus Hold
−0.7
−1.2
±1
µA
±100
±1
IIL
Input LOW Current
Standard VCC=Max., VI=GND
Bus Hold
µA
µA
µA
µA
mA
±100
IBBH
IBBL
Bus Hold Sustain Current on Bus Hold Input[10] VCC=Min.,
VI=2.0V
VI=0.8V
−50
+50
IBHHO
IBHLO
Bus Hold Overdrive Current on Bus Hold In-
put[10]
VCC=Max., VI=1.5V
TBD
±1
IOZH
High Impedance Output Current
(Three-State Output pins)
VCC=Max., VOUT=2.7V
µA
µA
IOZL
High Impedance Output Current
(Three-State Output pins)
VCC=Max., VOUT=0.5V
±1
IOS
IO
Short Circuit Current[11]
Output Drive Current[11]
Power-Off Disable
VCC=Max., VOUT=GND
VCC=Max., VOUT=2.5V
VCC=0V, VOUT≤4.5V[12]
−80
−50
−140
−200
−180
±1
mA
mA
µA
IOFF
Output Drive Characteristics for CY74FCT16501T
Parameter
Description
Test Conditions
VCC=Min., IOH=−3 mA
Min.
2.5
Typ.[8]
3.5
Max.
Unit
VOH
Output HIGH Voltage
V
VCC=Min., IOH=−15 mA
VCC=Min., IOH=−32 mA
VCC=Min., IOL=64 mA
2.4
3.5
2.0
3.0
VOL
Output LOW Voltage
0.2
0.55
V
Output Drive Characteristics for CY74FCT162501T, CY74FCT162H501T
Parameter
IODL
Description
Output LOW Current[11]
Output HIGH Current[11]
Output HIGH Voltage
Output LOW Voltage
Test Conditions
VCC=5V, VIN=VIH or VIL, VOUT=1.5V
VCC=5V, VIN=VIH or VIL, VOUT=1.5V
VCC=Min., IOH=−24 mA
Min.
60
Typ.[8]
115
Max.
150
Unit
mA
mA
V
IODH
−60
2.4
−115
3.3
−150
VOH
VOL
VCC=Min., IOL=24 mA
0.3
0.55
V
Notes:
8. Typical values are at VCC= 5.0V, TA= +25˚C ambient.
9. This parameter is specified but not tested.
10. Pins with bus hold are described in Pin Description.
11. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, IOS tests should be performed last.
12. Tested at +25˚C.
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