Datasheet > CSMM0420D-1R0M

CSMM0420D-1R0M

更新时间： 2024-04-09 18:57:54

品牌	Logo	应用领域
华新科技 - WALSIN		/
页数	文件大小	规格书
8页	853K
描述
SMD Resin Shielded Power Inductor: WLPN_E / CSME Series 1, 5.8A

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CSMM0420D-1R0M 数据手册

11. Reliability and Test Condition

Items

Requirements

Test Methods and Remarks

No removal or split of the termination or

other defects shall occur.

1. Solder the inductor to the testing jig (glass epoxy

board shown in Fing.7.1-1) using eutectic solder.

Then apply a force in the direction of the arrow.

2. 10N force.

Terminal

Strength

3. Keep time: 5±2s

1. Storage Temperature :125+/-5℃

2. Duration: 96 ±4 Hours

High

1. No visible mechanical damage.

2. Inductance change: Within ±10%

Temperature

3. Recovery: then measured at room ambient

temperature after placing 24 hours.

1. Temperature and time: -40±5℃

2. Duration: 96±4 hours

Low

1. No visible mechanical damage.

2. Inductance change: Within ±10%

Temperature

3. TRecovery: then measured at room ambient

temperature after placing 24 hours.

1. Frequency range:10HZ~55HZ~10HZ

2. Amplitude:1.5mm p-p

1. No visible mechanical damage.

2. Inductance change: Within ±10%

Vibration test

3. Direction: X, Y, Z

4. Time:1 minute/cycle,2hours per axis

1. Storage Temperature: 60+/-2℃

2. Relative Humidity: 90-95% RH

3. Duration : 96 ±4 Hours

High

Temperature

Storage

Tested

1. No visible mechanical damage.

2. Inductance change: Within ±10%

4. Recovery: then measured at room ambient

temperature after placing 24 hours.

1. No visible mechanical damage.

2. Inductance change: Within ±10%

1. Temperature and time: -40±3℃ for 30±3 min→105

℃ for 30±3min, please refer to Fig.7.7-1.

Thermal

Shock

2. Transforming interval: Max, 3 minute

3. Tested cycle: 100 cycles

4. The chip shall be stabilized at normal condition for

1~2 hours before measuring

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