MCR100 Series
i
CR05AS Series
SCR
Sensitive Gate
0.8 AMPERES RMS
300 thru 800 VOLTS
Silicon Controlled Rectifiers
Reverse Blocking Thyristors
PNPN devices designed for high volume, line-powered consumer
applications such as relay and lamp drivers, small motor controls, gate
drivers for larger thyristors, and sensing and detection circuits.
Supplied in an inexpensive plastic
SOT-89 package which is
G
readily adaptable for use in automatic insertion equipment.
• Sensitive Gate Allows Triggering by Microcontrollers and Other
Logic Circuits
A
K
• Blocking Voltage to 800 V
• On−State Current Rating of 0.8 Amperes RMS at 80°C
• High Surge Current Capability — 10 A
• Minimum and Maximum Values of IGT, VGT and IH Specified for
Ease of Design
• Immunity to dV/dt — 20 V/msec Minimum at 110°C
1
• Glass-Passivated Surface for Reliability and Uniformity
2
•
•
3
MAXIMUM RATINGS (T = 25°C unless otherwise noted)
J
Rating
Symbol
Value
Unit
SOT-89
(Note 1)
Peak Repetitive Off−State Voltage
V
DRM,
V
(T = *40 to 110°C, Sine Wave, 50 to
V
J
RRM
60 Hz; Gate Open)
CR05AS-3
CR05AS-4
CR05AS-6
CR05AS-8
300
400
600
800
PIN ASSIGNMENT
Gate
1
2
3
Anode
On-State RMS Current
(T = 80°C) 180° Conduction Angles
C
I
0.8
A
A
T(RMS)
Cathode
Peak Non-Repetitive Surge Current
(1/2 Cycle, Sine Wave, 60 Hz,
I
TSM
10
T = 25°C)
J
2
2
Circuit Fusing Consideration (t = 8.3 ms)
I t
0.415
0.1
A s
Forward Peak Gate Power
P
W
W
A
GM
(T = 25°C, Pulse Width v 1.0 ms)
A
Forward Average Gate Power
(T = 25°C, t = 8.3 ms)
A
P
0.10
1.0
G(AV)
Forward Peak Gate Current
I
GM
(T = 25°C, Pulse Width v 1.0 ms)
Reverse Peak Gate Voltage
A
V
GRM
5.0
V
(T = 25°C, Pulse Width v 1.0 ms)
Operating Junction Temperature Range
A
T
−40 to
110
°C
°C
J
@ Rate V
and V
RRM
DRM
Storage Temperature Range
T
stg
−40 to
150
4(1) V
DRM
and V for all types can be applied on a continuous basis. Ratings
RRM
apply for zero or negative gate voltage; however, positive gate voltage shall
not be applied concurrent with negative potential on the anode. Blocking
voltages shall not be tested with a constant source such that the voltage
ratings of the devices are exceeded.
1
D