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CM1293 PDF预览

CM1293

更新时间: 2024-10-02 12:19:55
品牌 Logo 应用领域
安森美 - ONSEMI /
页数 文件大小 规格书
10页 344K
描述
8-Channel Low Capacitance ESD Protection Arrays

CM1293 数据手册

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8-Channel Low Capacitance ESD  
Protection Arrays  
CM1293  
Features  
Product Description  
Eight channels of ESD protection  
The CM1293 family of diode arrays has been  
designed to provide ESD protection for electronic  
components or sub-systems requiring minimal  
capacitive loading. These devices are ideal for  
protecting systems with high data and clock rates or  
for circuits requiring low capacitive loading. Each  
ESD channel consists of a pair of diodes in series  
which steer the positive or negative ESD current  
pulse to either the positive (VP) or negative (VN)  
supply rail. A Zener diode is embedded between VP  
and VN, offering two advantages. First, it protects the  
VCC rail against ESD strikes, and second, it eliminates  
the need for a bypass capacitor that would otherwise  
be needed for absorbing positive ESD strikes to  
ground. The CM1293 will protect against ESD pulses  
up to ( 8kV contact discharge) per the IEC 61000-4-2  
Level 4 standard.  
Note: For 2 and 4 channel devices, see the  
CM1293A datasheet.  
Provides ESD protection to IEC61000-4-2  
±8kV contact discharge  
Low loading capacitance of 2.0pF max.  
Low clamping voltage  
Channel I/O to I/O capacitance 1.5pF typical  
Zener diode protects supply rail and eliminates  
the need for external by-pass capacitors  
Each I/O pin can withstand over 1000 ESD  
strikes*  
Available in MSOP, lead-free packaging  
Applications  
DVI ports, HDMI ports in notebooks, set top  
boxes, digital TVs, LCD displays  
Serial ATA ports in desktop PCs and hard disk  
drives  
PCI Express ports  
General purpose high-speed data line ESD  
protection  
This device is particularly well-suited for protecting  
systems using high-speed ports such as USB2.0,  
IEEE1394 (Firewire®, iLink), Serial ATA, DVI,  
HDMI and corresponding ports in removable storage,  
digital camcorders, DVD-RW drives and other  
applications  
where  
extremely  
low  
loading  
capacitance with ESD protection are required in a  
small package footprint.  
Block Diagram  
*Standard test condition is IEC61000-4-2 level 4 test circuit with each pin subjected to 8kV contact discharge for 1000 pulses. Discharges are timed at 1 second intervals and all 1000 strikes are completed in one  
continuous test run. The part is then subjected to standard production test to verify that all of the tested parameters are within spec after the 1000 strikes.  
©2010 SCILLC. All rights reserved.  
April 2010 – Rev. 3  
Publication Order Number:  
CM1293/D  

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