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CM1231 PDF预览

CM1231

更新时间: 2024-10-02 04:36:51
品牌 Logo 应用领域
CALMIRCO /
页数 文件大小 规格书
11页 244K
描述
Two-Channel PicoGuard XPTM ESD Clamp Protection Array

CM1231 数据手册

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Issue X-1  
CM1231  
Two-Channel PicoGuard XPTM ESD Clamp Protection Array  
Features  
Product Description  
TM  
Two channels of ESD protection  
Exceeds ESD protection to IEC61000-4-2 Level 4:  
12kV contact discharge (OUT pins)  
The CM1231 is a member of the XtremeESD  
product family and is specifically designed for next  
generation deep submicron ASIC protection. These  
devices are ideal for protecting systems with high data  
and clock rates and for circuits requiring low capacitive  
loading such as USB 2.0.  
Two-stage matched clamp architecture  
Matching-of-series resistor (R) of 10mΩ typical  
Flow-through routing for high-speed signal integrity  
Differential channel input capacitance matching of  
0.02pF typical.  
TM  
The CM1231 incorporates the PicoGuard XP  
dual  
Improved powered ASIC latchup protection  
Dramatic improvement in ESD protection vs. best  
in class single-stage diode arrays  
stage ESD architecture which offers dramatically  
higher system level ESD protection compared with  
traditional single clamp designs. In addition, the  
CM1231 provides a controlled filter roll-off for even  
greater spurious EMI suppression and signal integrity.  
The CM1231 protects against ESD pulses up to 12kV  
contact on the “OUT” pins per the IEC 61000-4-2  
standard.  
40% reduction in peak clamping voltage  
40% reduction in peak residual current  
Withstands over 1000 ESD strikes*  
Available in a SOT23-6 package  
Applications  
The device also features easily routed "pass-through"  
differential pinouts in a 6-lead SOT23 package.  
USB devices data port protection  
General high-speed data line ESD protection  
Electrical Schematic  
Positive Supply Rail  
VP  
VCC  
VP  
CM1231  
AOUT  
Connector  
BOUT  
AIN  
1Ω  
1Ω  
Circuitry  
Under  
Protection  
BIN  
VN  
VN  
Ground Rail  
*Standard test condition is IEC61000-4-2 level 4 test circuit with each (AOUT/BOUT) pin subjected to 12kV contact discharge for 1000 pulses. Discharges are timed at 1 second intervals and all 1000 strikes are completed in one  
continuous test run.  
© 2007 California Micro Devices Corp. All rights reserved.  
12/17/07  
490 N. McCarthy Blvd., Milpitas, CA 95035-5112  
Tel: 408.263.3214  
Fax: 408.263.7846  
www.cmd.com  
1

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