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CM1233_14 PDF预览

CM1233_14

更新时间: 2024-10-03 01:23:27
品牌 Logo 应用领域
安森美 - ONSEMI /
页数 文件大小 规格书
9页 152K
描述
ESD Clamp Array for High Speed Data Line Protection

CM1233_14 数据手册

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CM1233  
ESD Clamp Array for High  
Speed Data Line Protection  
Product Description  
The CM1233 is ideal for protecting systems with high data and  
clock rates or for circuits requiring low capacitive loading and tightly  
controlled signal skews (with channeltochannel matching at 2%  
max deviation).  
http://onsemi.com  
The device is particularly wellsuited for protecting systems using  
highspeed ports such as DVI or HDMI, along with corresponding  
ports in removable storage, digital camcorders, DVDRW drives and  
other applications where extremely low loading capacitance with ESD  
protection are required.  
The CM1233 also features easily routed “passthrough” pinouts in a  
RoHS compliant (leadfree), 16lead WDFN, small footprint  
package.  
16  
1
WDFN16  
DE SUFFIX  
CASE 511AY  
PINOUT DIAGRAM  
Features  
ESD Protection for 4 Pairs of Differential Channels  
ESD Protection to IEC6100042 Level 4 at 8 kV Contact  
Discharge  
Passthrough Impedance Matched Clamp Architecture  
Flowthrough Routing for Highspeed Signal Integrity  
Minimal Line Capacitance Change with Temperature and Voltage  
100 W Matched Impedance for Each Paired Differential Channel  
Each I/O Pin can Withstand Over 1000 ESD Strikes*  
RoHS Compliant (leadfree) WDFN16 Package  
Out_1+  
In_1+  
1
Out_1  
Out_2+  
Out_2−  
Out_3+  
Out_3−  
Out_4+  
Out_4−  
In_1−  
In_2+  
In_2−  
In_3+  
In_3−  
In_4+  
In_4−  
GND  
(Bottom View)  
Applications  
ORDERING INFORMATION  
See detailed ordering and shipping information in the package  
dimensions section on page 8 of this data sheet.  
DVI Ports, HDMI Ports in Notebooks, Set Top Boxes, Digital TVs,  
and LCD Displays  
General Purpose Highspeed Data Line ESD Protection  
*Standard test condition is IEC6100042 level 4 test circuit with each pin  
subjected to 8 kV contact discharge for 1000 pulses. Discharges are timed at  
1 second intervals and all 1000 strikes are completed in one continuous test run.  
The part is then subjected to standard production test to verify that all of the  
tested parameters are within spec after the 1000 strikes.  
© Semiconductor Components Industries, LLC, 2014  
1
Publication Order Number:  
January, 2014 Rev. 4  
CM1233/D  

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