CF5005B series
SPECIFICATIONS
Absolute Maximum Ratings
V
= 0V
SS
Parameter
Symbol
Condition
Rating
Unit
V
Supply voltage range
Input voltage range
V
−0.5 to 7.0
DD
V
−0.5 to V + 0.5
DD
V
IN
Output voltage range
Operating temperature range
Storage temperature range
Output current
V
−0.5 to V + 0.5
DD
V
OUT
T
−40 to 85
−65 to 150
25
°C
°C
mA
opr
T
stg
I
OUT
Recommended Operating Conditions
V
= 0V, f ≤ 165MHz, C ≤ 15pF unless otherwise noted.
L
SS
Rating
Parameter
Symbol
Condition
Unit
min
typ
–
max
Operating supply voltage
Input voltage
V
3.0
3.6
V
V
DD
V
V
–
V
IN
SS
DD
Operating temperature
T
−20
–
80
°C
OPR
Electrical Characteristics
V
= 3.0 to 3.6V, V = 0V, Ta = −20 to 80°C unless otherwise noted.
SS
DD
Rating
Parameter
Symbol
Condition
Unit
min
2.5
–
typ
2.7
0.3
–
max
–
HIGH-level output voltage
LOW-level output voltage
V
Q: Measurement cct 1, V = 3.0V, I = 8mA
DD OH
V
V
OH
V
Q: Measurement cct 2, V = 3.0V, I = 8mA
DD OL
0.4
10
10
–
OL
V
= V
= V
–
OH
OL
DD
Q: Measurement cct 2, INHN = LOW,
= 3.6V
Output leakage current
I
ꢀA
Z
V
DD
V
–
–
SS
HIGH-level input voltage
LOW-level input voltage
V
INHN
INHN
0.7V
–
V
V
IH
DD
V
–
–
–
0.3V
DD
IL
f = 133MHz
f = 156MHz
30
35
–
65
80
Measurement cct 3, load cct 1,
INHN = open, C = 15pF
Current consumption
Standby current
I
mA
DD
L
–
I
Measurement cct 3, INHN = LOW
Measurement cct 4
–
10
ꢀA
MΩ
kΩ
kΩ
kΩ
pF
ST
R
INHN = V
0.4
50
–
4
UP1
SS
INHN pull-up resistance
R
INHN = 0.7V
–
150
2.64
150
10.7
1.07
1.07
6.42
3.21
UP2
DD
AC feedback resistance
DC feedback resistance
AC feedback capacitance
R
Design value. A monitor pattern on a wafer is tested.
Measurement cct 5
1.76
50
2.2
–
f1
R
f2
C
Design value. A monitor pattern on a wafer is tested.
9.3
0.93
0.93
5.58
2.79
10
1
f
CF5005BLA
Design value. A monitor pattern on a
wafer is tested.
CF5005BLB
C
pF
pF
G
1
Built-in capacitance
CF5005BLA
6
Design value. A monitor pattern on a
wafer is tested.
CF5005BLB
C
D
3
SEIKO NPC CORPORATION —3