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CD4060BMJ-MIL PDF预览

CD4060BMJ-MIL

更新时间: 2024-11-21 20:29:47
品牌 Logo 应用领域
德州仪器 - TI 逻辑集成电路触发器
页数 文件大小 规格书
9页 17K
描述
4000/14000/40000 SERIES, ASYN NEGATIVE EDGE TRIGGERED 14-BIT UP BINARY COUNTER, CDIP16, CERAMIC, DIP-16

CD4060BMJ-MIL 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
包装说明:DIP, DIP16,.3Reach Compliance Code:unknown
HTS代码:8542.39.00.01风险等级:5.21
Is Samacsys:N计数方向:UP
系列:4000/14000/40000JESD-30 代码:R-GDIP-T16
JESD-609代码:e0长度:19.43 mm
负载/预设输入:NO逻辑集成电路类型:BINARY COUNTER
最大频率@ Nom-Sup:1000000 Hz工作模式:ASYNCHRONOUS
位数:14功能数量:1
端子数量:16最高工作温度:125 °C
最低工作温度:-55 °C封装主体材料:CERAMIC, GLASS-SEALED
封装代码:DIP封装等效代码:DIP16,.3
封装形状:RECTANGULAR封装形式:IN-LINE
峰值回流温度(摄氏度):NOT SPECIFIED电源:5/15 V
传播延迟(tpd):1300 ns认证状态:Not Qualified
筛选级别:MIL-STD-883 Class B (Modified)座面最大高度:5.08 mm
子类别:Counters最大供电电压 (Vsup):15 V
最小供电电压 (Vsup):3 V标称供电电压 (Vsup):5 V
表面贴装:NO技术:CMOS
温度等级:MILITARY端子面层:Tin/Lead (Sn/Pb)
端子形式:THROUGH-HOLE端子节距:2.54 mm
端子位置:DUAL处于峰值回流温度下的最长时间:NOT SPECIFIED
触发器类型:NEGATIVE EDGE宽度:7.62 mm
最小 fmax:4 MHzBase Number Matches:1

CD4060BMJ-MIL 数据手册

 浏览型号CD4060BMJ-MIL的Datasheet PDF文件第2页浏览型号CD4060BMJ-MIL的Datasheet PDF文件第3页浏览型号CD4060BMJ-MIL的Datasheet PDF文件第4页浏览型号CD4060BMJ-MIL的Datasheet PDF文件第5页浏览型号CD4060BMJ-MIL的Datasheet PDF文件第6页浏览型号CD4060BMJ-MIL的Datasheet PDF文件第7页 
MICROCIRCUIT DATA SHEET  
Original Creation Date: 10/10/95  
Last Update Date: 05/19/98  
MNCD4060BM-X REV 1A0  
Last Major Revision Date: 03/05/98  
14-STAGE RIPPLE CARRY BINARY COUNTERS  
General Description  
The CD4060BM are 14-stage ripple carry binary counters. The counters are advanced one  
count on the negative transition of each clock pulse. The counters are reset to the zero  
state by a logical "1" at the reset input independent of clock.  
Industry Part Number  
NS Part Numbers  
CD4060BM  
CD4060BMJ-MIL  
CD4060BMW-MIL  
Prime Die  
CD4060BM  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25  
2
Static tests at  
+125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
+25  
Quality Conformance Inspection  
5
+125  
-55  
6
MIL-STD-883, Method 5005  
7
+25  
8A  
8B  
9
+125  
-55  
+25  
10  
11  
+125  
-55  
1

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