MULTILAVER CHIP FERRITE BEADS
序号
项目
要求
试验方法及备注
No.
Items
Requirements
Test Methods and Remarks
耐低温
Low
无可见机械损伤,
测试温度:-55±2℃
+24
阻抗变化率小于±30%。
测试时间:1000
h
−0
5
temperature
resistance
No mechanical damage.
Temperature:-55±2℃
+24
Impedance change: within ±30%
Testing time: 1000
h
−0
测试基板:玻璃环氧树脂基板
加压速度为 0.5mm/s,弯度:2mm,保持时间 20s±1s
Testing board: glass epoxy-resin substrate
For 0.5 mm/s compression speed, curvature: 2mm, hold
time20s±1s 。
抗弯强度
Bending
strength
无可见机械损伤
6
No mechanical damage
振幅:1.5mm
测试时间:沿三个垂直方向各做 2 小时
频率范围:10Hz~55Hz~10Hz (1 分钟)
Amplitude modulation: 1.5mm
无可见机械损伤,
振动
阻抗变化率小于±30%。
No mechanical damage.
Impedance change: within ±30%
Vibration
7
Test time: A period of 2h in each of 3 mutually perpendicular
directions.
Frequency range: 10Hz to 55Hz to 10Hz for 1min.
+24
无可见机械损伤,
测试时间: 1000
h
−0
耐高温
High temperature
resistance
阻抗变化率小于±30%。
No mechanical damage.
Impedance change: within ±30%
测试温度:125±2℃
8
+24
Testing time: 1000
h
−0
Temperature: 125±2℃
湿度:90%~95% RH,温度:60℃±2℃
+24
无可见机械损伤,
恒定湿热
测试时间: 1000
h
−0
阻抗变化率小于±30%。
No mechanical damage.
Static Humidity
9
Humidity: 90% to 95% RH
Temperature: 60℃±2℃
Impedance change: within ±30%
+24
Testing time: 1000
h
−0
施加电流:额定电流
+24
高温负载
High temperature
load
无可见机械损伤,
测试时间: 1000
测试温度:85℃±2℃
h
−0
阻抗变化率小于±30%。
No mechanical damage.
10
impose current: at room
+24
−0
Testing time: 1000
h
Impedance change: within ±30%
Temperature: 85±2℃
8