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C8051F023 PDF预览

C8051F023

更新时间: 2024-02-25 02:27:01
品牌 Logo 应用领域
芯科 - SILICON 闪存
页数 文件大小 规格书
2页 194K
描述
25 MIPS, 64 kB Flash, 10-Bit ADC, 64-Pin Mixed-Signal MCU

C8051F023 数据手册

 浏览型号C8051F023的Datasheet PDF文件第2页 
C8051F023  
25 MIPS, 64 kB Flash, 10-Bit ADC, 64-Pin Mixed-Signal MCU  
Analog Peripherals  
High-Speed 8051 µC Core  
10-Bit ADC  
-
Pipelined instruction architecture; executes 70% of instructions in 1 or 2  
system clocks  
-
-
-
-
-
-
±1 LSB INL; no missing codes  
-
Up to 25 MIPS throughput with 25 MHz system clock  
22 vectored interrupt sources  
Programmable throughput up to 100 ksps  
8 external inputs; programmable as single-ended or differential  
Programmable amplifier gain: 16, 8, 4, 2, 1, 0.5  
Data-dependent windowed interrupt generator  
Built-in temperature sensor (±3 °C)  
-
Memory  
-
-
4352 bytes data RAM  
64 kB Flash; in-system programmable in 512-byte sectors (512 bytes  
8-Bit ADC  
are reserved)  
-
External parallel data memory interface  
-
-
-
-
±1 LSB INL; no missing codes  
Programmable throughput up to 500 ksps  
8 external inputs  
Programmable amplifier gain: 4, 2, 1, 0.5  
Digital Peripherals  
-
-
32 port I/O; all are 5 V tolerant  
Hardware SMBus™ (I2C™ compatible), SPI™, and two UART serial  
Two 12-Bit DACs  
ports available concurrently  
-
Can synchronize outputs to timers for jitter-free waveform generation  
-
-
-
-
Programmable 16-bit counter/timer array with 5 capture/compare mod-  
ules  
Two Comparators  
5 general-purpose 16-bit counter/timers  
Dedicated watchdog timer; bidirectional reset  
Real-time clock mode using Timer 3 or PCA  
Internal Voltage Reference  
V
Monitor/Brown-out Detector  
DD  
On-Chip JTAG Debug & Boundary Scan  
Clock Sources  
-
-
-
-
On-chip debug circuitry facilitates full speed, non-intrusive in-system  
debug (no emulator required)  
-
-
-
Internal programmable oscillator: 2–16 MHz  
External oscillator: Crystal, RC, C, or Clock  
Can switch between clock sources on-the-fly  
Provides breakpoints, single stepping, watchpoints, stack monitor  
Inspect/modify memory and registers  
Superior performance to emulation systems using ICE-chips, target  
Supply Voltage: 2.7 to 3.6 V  
pods, and sockets  
-
Typical operating current: 10 mA at 25 MHz  
Multiple power saving sleep and shutdown modes  
-
IEEE1149.1 compliant boundary scan  
-
64-Pin TQFP  
Temperature Range: –40 to +85 °C  
VDD  
VDD  
Port I/O  
Config.  
VDD  
DGND  
DGND  
DGND  
Digital Power  
Analog Power  
P0.0  
P0.7  
UART0  
P0  
UART1  
8
0
5
1
Drv  
AV+  
C
SMBus  
AGND  
P1.0/AIN1.0  
P1.7/AIN1.7  
R
P1  
SPI Bus  
PCA  
Drv  
O
S
S
B
A
R
TCK  
TMS  
TDI  
Boundary Scan  
Debug HW  
JTAG  
Logic  
Timers 0,  
1, 2, 4  
P2.0  
P2.7  
TDO  
P2  
SFR Bus  
Drv  
Reset  
RST  
Timer 3/  
RTC  
VDD  
64 kB  
P3.0  
P3.7  
WDT  
MONEN  
P3  
Monitor  
P0, P1,  
P2, P3  
Latches  
C
o
r
FLASH  
Drv  
External  
Oscillator  
Circuit  
XTAL1  
XTAL2  
256 Byte  
RAM  
Crossbar  
Config.  
REFADC  
VDD  
System  
Clock  
Internal  
4 kB  
Oscillator  
A
M
U
X
ADC  
e
RAM  
8:1  
Prog  
Gain  
500 ksps  
(8-Bit)  
VREF  
DAC1  
VREF  
External Data Memory Bus  
DAC1  
(12-Bit)  
C
T
L
P4 Latch  
Bus Control  
P4  
DRV  
DAC0  
DAC0  
(12-Bit)  
(REFADC)  
VREFA  
P5 Latch  
P6 Latch  
P5  
AIN0.0  
AIN0.1  
AIN0.2  
AIN0.3  
AIN0.4  
AIN0.5  
AIN0.6  
AIN0.7  
A
d
d
r
DRV  
Address Bus  
Data Bus  
ADC  
A
M
U
X
P6  
Prog  
Gain  
100 ksps  
(10-Bit)  
DRV  
D
a
t
P7 Latch  
TEMP  
SENSOR  
P7  
DRV  
CP0+  
CP0-  
CP1+  
CP1-  
CP0  
a
CP1  
Precision Mixed Signal  
Copyright © 2004 by Silicon Laboratories  
6.15.2004  

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