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BQ7721605

更新时间： 2022-05-14 22:19:06
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德州仪器 - TI /
页数 文件大小 规格书
25页 1529K
描述
BQ77216 Voltage and Temperature Protection for 3-Series to 16-Series Cell Li-Ion Batteries with Internal Delay Timer

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BQ7721605 数据手册

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BQ77216  
www.ti.com  
SLUSE36B – DECEMBER 2020 – REVISED JULY 2021  
Table 7-1. 24-Lead Pin Functions (continued)  
NO. NAME  
TYPE DESCRIPTION  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
V5  
I
—
—
I
Sense input for positive voltage of the fifth cell from the bottom of the stack  
Not electrically connected and can be left floating  
NC  
NC  
Not electrically connected and can be left floating  
V4  
Sense input for positive voltage of the fourth cell from the bottom of the stack  
Sense input for positive voltage of the third cell from the bottom of the stack  
Sense input for positive voltage of the second cell from the bottom of the stack  
Sense input for positive voltage of the lowest cell in the stack  
V3  
I
V2  
I
V1  
I
VSS  
COUT  
DOUT  
TS  
P
O
O
I
Electrically connected to IC ground and negative terminal of the lowest cell in the stack  
Output drive for overvoltage, open wire, and overtemperature. It can be left floating if not used.  
Output drive for undervoltage, open wire, and overtemperature. It can be left floating if not used.  
Temperature sensor input. If not used, leave it NC.  
I = Input, O = Output, P = Power Connection  
8 Specifications  
8.1 Absolute Maximum Ratings  
over operating free-air temperature range (unless otherwise noted)(1)  
MIN  
–0.3  
–0.3  
–0.3  
–0.3  
–40  
MAX  
85  
UNIT  
V
Supply voltage range  
Input voltage range  
VDD - VSS  
Vn - VSS where n = 1 to 16  
TS  
85  
V
1.5  
85  
V
Output voltage range  
COUT - VSS, DOUT - VSS  
V
Functional temperature,TFUNC  
Storage temperature, TSTG  
110  
150  
°C  
°C  
–65  
(1) Stresses beyond those listed under Absolute Maximum Rating may cause permanent damage to the device. These are stress  
ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated  
under Recommended Operating Condition. Exposure to absolute-maximum-rated conditions for extended periods may affect device  
reliability.  
8.2 ESD Ratings  
VALUE  
UNIT  
Human body model (HBM), per ANSI/ESDA/  
JEDEC JS-001, all pins(1)  
±2000  
V(ESD)  
Electrostatic discharge  
V
Charged device model (CDM), per JEDEC  
specification JESD22-C101, all pins(2)  
±500  
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.  
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.  
8.3 Recommended Operating Conditions  
over operating free-air temperature range (unless otherwise noted)  
MIN  
5
NOM  
MAX  
75  
UNIT  
V
VDD  
VIN  
Supply voltage (1)  
Input voltage range of Vn - Vn-1 where n = 2 to 16 and V1 - VSS  
TS  
0
5
V
0
1.5  
13  
V
VCTM  
CTS  
TA  
Customer Test Mode Entry VDD > V16 + VCTM  
Total capacitance on the TS Pin  
Ambient temperature  
12  
V
200  
85  
pF  
°C  
–40  
Copyright © 2021 Texas Instruments Incorporated  
4
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Product Folder Links: BQ77216  
 
 
 
 
 
 
 
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