Datasheet > ATF16V8B/BQ/BQL

ATF16V8B/BQ/BQL

更新时间： 2022-01-18 22:57:00

品牌	Logo	应用领域
其他 - ETC		可编程逻辑器件
页数	文件大小	规格书
19页	549K
描述
ATF16V8B/BQ/BQL [Updated 4/01. 19 Pages] 250 gate electrically erasable PLD. 20 pins

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ATF16V8B/BQ/BQL 数据手册

ATF16V8B(QL)

DC Characteristics

Symbol

Parameter

Condition

Min

Typ

Max

Units

Input or I/O Low

Leakage Current

I_IL

0 ≤=V_IN≤=V_IL(Max)

-35

-100

µA

Input or I/O High

Leakage Current

I_IH

3.5 ≤=V_IN≤=V_CC

µA

Com.

Ind.

100

B-7, -10

B-15

Com.

Ind.

B-15

B-25

Com.

Ind.

_CC= Max,

Power Supply

Current, Standby

I_CC

V_IN= Max,

Outputs Open

B-25

BQ-10

BQL-15

BQL-25

Com.

Ind.

Com.

Ind.

Com.

Ind.

B-7, -10

B-15

Com.

Ind.

B-15

B-25

Com.

Ind.

V_CC= Max,

Outputs Open,

f=15 MHz

Clocked Power

Supply Current

I_CC2

B-25

BQ-10

BQL-15

BQL-25

Com.

Ind.

Com.

Ind.

Output Short

Circuit Current

(1)

I_OS

V_OUT= 0.5 V

-130

V_IL

V_IH

Input Low Voltage

Input High Voltage

-0.5

2.0

0.8

V_CC+0.75

V_IN=V_IHor V_IL,

I_OL= -24 mA

Com., Ind.

V_OL

Output High Voltage

0.5

V_CC=Min

V_IN=V_IHor V_IL,

V_CC=Min

V_OH

Output High Voltage

I_OH= -4.0 mA

2.4

Notes: 1. Not more than one output at a time should be shorted. Duration of short circuit test should not exceed 30 sec.

2. Shaded parts are obsolete with a last time buy date of 19 August 1999.

1 234 5 6 7...19

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