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AS7C33512PFS32A-250BC PDF预览

AS7C33512PFS32A-250BC

更新时间: 2024-02-25 17:59:54
品牌 Logo 应用领域
ALSC 静态存储器
页数 文件大小 规格书
21页 463K
描述
Standard SRAM, 512KX32, 6.5ns, CMOS, PBGA165, BGA-165

AS7C33512PFS32A-250BC 数据手册

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AS7C33512PFS32A  
AS7C33512PFS36A  
®
Signal descriptions  
Pin  
CLK  
A0A19  
I/ O Properties Description  
I
I
CLOCK Clock. All inputs except OE, FT, ZZ, and LBO are synchronous to this clock.  
SYNC  
SYNC  
Address. Sampled when all chip enables are active and when ADSC or ADSP are asserted.  
Data. Driven as output when the chip is enabled and when OE is active.  
DQ[a,b,c,d] I/ O  
Master chip enable. Sampled on clock edges when ADSP or ADSC is active. When CE0 is  
inactive, ADSP is blocked. Refer to the “Synchronous truth table” for more information.  
CE0  
I
I
SYNC  
SYNC  
Synchronous chip enables, active high, and active low, respectively. Sampled on clock edges  
when ADSC is active or when CE0 and ADSP are active.  
CE1, CE2  
ADSP  
ADSC  
ADV  
I
I
I
SYNC  
SYNC  
SYNC  
Address strobe processor. Asserted low to load a new address or to enter standby mode.  
Address strobe controller. Asserted low to load a new address or to enter standby mode.  
Advance. Asserted low to continue burst read/ write.  
Global write enable. Asserted low to write all 32/ 36 and 18 bits. When high, BWE and  
BW[a:d] control write enable.  
GWE  
BWE  
I
I
SYNC  
SYNC  
Byte write enable. Asserted low with GWE high to enable effect of BW[a:d] inputs.  
Write enables. Used to control write of individual bytes when GWE is high and BWE is low. If  
any of BW[a:d] is active with GWE high and BWE low, the cycle is a write cycle. If all BW[a:d]  
are inactive, the cycle is a read cycle.  
BW[a,b,c,d]  
I
SYNC  
OE  
I
I
ASYNC Asynchronous output enable. I/ O pins are driven when OE is active and chip is in read mode.  
Count mode. When driven high, count sequence follows Intel XOR convention. When driven  
STATIC  
LBO  
low, count sequence follows linear convention. This signal is internally pulled high.  
TDO  
TDI  
O
I
SYNC  
SYNC  
Serial data-out to the JTAG circuit. Delivers data on the negative edge of TCK (BGA only).  
Serial data-in to the JTAG circuit. Sampled on the rising edge of TCK (BGA only).  
This pin controls the Test Access Port state machine. Sampled on the rising edge of TCK (BGA  
only).  
TMS  
TCK  
I
I
SYNC  
Test Clock  
STATIC  
Test Clock. All inputs are sampled on the rising edge of TCK. All outputs are driven from the  
falling edge of TCK.  
Flow-through mode.When low, enables single register flow-through mode. Connect to VDD if  
unused or for pipelined operation.  
FT  
ZZ  
I
I
ASYNC Snooze. Places device in low power mode; data is retained. Connect to GND if unused.  
Write enable truth table (per byte)  
Function  
GWE BWE BWa  
BWb  
X
BWc BWd  
L
H
H
H
H
H
X
L
L
L
H
L
X
L
X
L
X
L
Write All Bytes  
L
Write Byte a  
L
H
H
L
H
L
Write Byte c and d  
H
X
H
H
X
X
H
X
H
Read  
H
ꢀꢁꢂꢃꢄX = dont care, L = low, H = high, n = a, b, c, d; BWE, BWn = internal write signal.  
12/ 2/ 02, v. 0.9.8 Advance Info  
Alliance Semiconductor  
4 of 21  

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