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AS29F040CW-60/IT PDF预览

AS29F040CW-60/IT

更新时间: 2024-01-08 12:57:21
品牌 Logo 应用领域
AUSTIN 内存集成电路
页数 文件大小 规格书
27页 1428K
描述
512K x 8 FLASH UNIFORM SECTOR 5.0V FLASH MEMORY

AS29F040CW-60/IT 技术参数

是否Rohs认证: 不符合生命周期:Active
零件包装代码:DIP包装说明:DIP, DIP32,.6
针数:32Reach Compliance Code:compliant
ECCN代码:3A001.A.2.CHTS代码:8542.32.00.51
风险等级:5.52Is Samacsys:N
最长访问时间:60 ns命令用户界面:YES
数据轮询:YES耐久性:1000000 Write/Erase Cycles
JESD-30 代码:R-CDIP-T32长度:42.418 mm
内存密度:4194304 bit内存集成电路类型:FLASH
内存宽度:8功能数量:1
部门数/规模:8端子数量:32
字数:524288 words字数代码:512000
工作模式:SYNCHRONOUS最高工作温度:125 °C
最低工作温度:-55 °C组织:512KX8
封装主体材料:CERAMIC, METAL-SEALED COFIRED封装代码:DIP
封装等效代码:DIP32,.6封装形状:RECTANGULAR
封装形式:IN-LINE并行/串行:PARALLEL
峰值回流温度(摄氏度):NOT SPECIFIED电源:5 V
编程电压:5 V认证状态:Not Qualified
筛选级别:38535Q/M;38534H;883B座面最大高度:5.08 mm
部门规模:64K最大待机电流:0.000005 A
子类别:Flash Memories最大压摆率:0.04 mA
最大供电电压 (Vsup):5.5 V最小供电电压 (Vsup):4.5 V
标称供电电压 (Vsup):5 V表面贴装:NO
技术:CMOS温度等级:MILITARY
端子形式:THROUGH-HOLE端子节距:2.54 mm
端子位置:DUAL处于峰值回流温度下的最长时间:NOT SPECIFIED
切换位:YES类型:NOR TYPE
宽度:15.24 mmBase Number Matches:1

AS29F040CW-60/IT 数据手册

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FLASH  
AS29F040  
Austin Semiconductor, Inc.  
ERASE AND PROGRAMMING PERFORMANCE  
LIMITS  
1
2
TYP  
MAX  
UNIT  
PARAMETER  
COMMENTS  
Sector Erase Time  
1
8
sec  
4
Excludes 00h programming prior to erasure  
Chip Erase Time  
8
7
64  
sec  
µs  
Byte Programming Time  
300  
5
Excludes system-level overhead  
3
3ꢀ6  
10ꢀ8  
sec  
Chip Programming Time  
NOTES:  
1. Typical program and erase times assume the following conditions: 25°C, 5.0V VCC, 1 million cycles. Additionally, programming typicals  
assume checkerboard pattern.  
2. Under worst case conditions of 90°C, VCC = 4.5V; 1,000,000 cycles.  
3. The typical chip programming time is considerably less than the maximum chip programming time listed, since most bytes program faster  
than the maximum byte program time listed. If the maximum byte program time given is exceeded, only then does the device set DQ5 = 1.  
See the section on DQ5 for further information.  
4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure.  
5. System-level overhead is the time required to execute the four-bus-cycle command sequence for programming. See Table 4 for further  
information on command definitions.  
6. The device has a minimum guaranteed erase and program cycle endurance of 1 million cycles.  
LATCHUP CHARACTERISTIC  
PARAMETER  
MIN  
MAX  
V + 1ꢀ0V  
CC  
Input voltage with respect to V on all I/O pins  
-1ꢀ0V  
SS  
V
Current  
-100mA  
+100mA  
CC  
NOTES: Includes all pins except VCC  
.
Test conditions: VCC = 5.0V, one pin at a time.  
PIN CAPACITANCE  
PARAMETER  
CONDITIONS SYMBOL  
= 0  
TYP  
MAX  
UNIT  
Input Capacitance  
V
C
4
6
pF  
IN  
IN  
Output Capacitance  
V
= 0  
C
8
8
12  
12  
pF  
pF  
OUT  
OUT  
Control Pin Capacitance  
V
= 0  
C
IN2  
PP  
NOTES:  
1. Sampled, not 100% tested.  
2. Test conditions TA = 25°C, f = 1.0 MHz  
DATARETENTION  
PARAMETER  
CONDITIONS  
150°C  
MIN  
10  
20  
UNIT  
Years  
Years  
Minimum Pattern Data Retention Time  
125°C  
AS29F040  
AustinSemiconductor,Inc.reservestherighttochangeproductsorspecificationswithoutnotice.  
Rev. 2.2 09/07  
21  

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