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AM27C010-55PI PDF预览

AM27C010-55PI

更新时间: 2024-01-02 00:15:42
品牌 Logo 应用领域
飞索 - SPANSION OTP只读存储器光电二极管内存集成电路
页数 文件大小 规格书
12页 178K
描述
OTP ROM, 128KX8, 55ns, CMOS, PDIP32, PLASTIC, DIP-32

AM27C010-55PI 技术参数

生命周期:Obsolete零件包装代码:DIP
包装说明:DIP,针数:32
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8542.32.00.71风险等级:5.55
Is Samacsys:N最长访问时间:55 ns
JESD-30 代码:R-PDIP-T32长度:42.037 mm
内存密度:1048576 bit内存集成电路类型:OTP ROM
内存宽度:8功能数量:1
端子数量:32字数:131072 words
字数代码:128000工作模式:ASYNCHRONOUS
最高工作温度:85 °C最低工作温度:-40 °C
组织:128KX8封装主体材料:PLASTIC/EPOXY
封装代码:DIP封装形状:RECTANGULAR
封装形式:IN-LINE并行/串行:PARALLEL
认证状态:Not Qualified座面最大高度:5.715 mm
最大供电电压 (Vsup):5.5 V最小供电电压 (Vsup):4.5 V
标称供电电压 (Vsup):5 V表面贴装:NO
技术:CMOS温度等级:INDUSTRIAL
端子形式:THROUGH-HOLE端子节距:2.54 mm
端子位置:DUAL宽度:15.24 mm
Base Number Matches:1

AM27C010-55PI 数据手册

 浏览型号AM27C010-55PI的Datasheet PDF文件第2页浏览型号AM27C010-55PI的Datasheet PDF文件第3页浏览型号AM27C010-55PI的Datasheet PDF文件第4页浏览型号AM27C010-55PI的Datasheet PDF文件第6页浏览型号AM27C010-55PI的Datasheet PDF文件第7页浏览型号AM27C010-55PI的Datasheet PDF文件第8页 
FUNCTIONAL DESCRIPTION  
Device Erasure  
V
= 12.75 V ± 0.25 V and PGM# LOW and OE#  
PP  
HIGH will program that particular device. A high-level  
CE# input inhibits the other devices from being pro-  
grammed.  
In order to clear all locations of their programmed con-  
tents, the device must be exposed to an ultraviolet light  
source. A dosage of 15 W seconds/cm is required to  
2
completely erase the device. This dosage can be ob-  
Program Verify  
tained by exposure to an ultraviolet lamp—wavelength  
A verification should be performed on the programmed  
bits to determine that they were correctly programmed.  
The verify should be performed with OE# and CE#, at  
2
of 2537 Å—with intensity of 12,000 µW/cm for 15 to 20  
minutes. The device should be directly under and about  
one inch from the source, and all filters should be re-  
moved from the UV light source prior to erasure.  
V , PGM# at V , and V between 12.5 V and 13.0 V.  
IL  
IH  
PP  
Autoselect Mode  
Note that all UV erasable devices will erase with light  
sources having wavelengths shorter than 4000 Å, such  
as fluorescent light and sunlight. Although the erasure  
process happens over a much longer time period, ex-  
posure to any light source should be prevented for  
maximum system reliability. Simply cover the package  
window with an opaque label or substance.  
The autoselect mode provides manufacturer and de-  
vice identification through identifier codes on DQ0–  
DQ7. This mode is primarily intended for programming  
equipment to automatically match a device to be pro-  
grammed with its corresponding programming algo-  
rithm. This mode is functional in the 25°C ± 5°C  
ambient temperature range that is required when pro-  
gramming the device.  
Device Programming  
Upon delivery, or after each erasure, the device has  
all of its bits in the “ONE”, or HIGH state. “ZEROs” are  
loaded into the device through the programming pro-  
cedure.  
To activate this mode, the programming equipment  
must force V on address line A9. Two identifier bytes  
H
may then be sequenced from the device outputs by tog-  
gling address line A0 from V to V (that is, changing  
IL  
IH  
The device enters the programming mode when 12.75  
the address from 00h to 01h). All other address lines  
must be held at V during the autoselect mode.  
V ± 0.25 V is applied to the V  
pin, and CE# and  
PP  
IL  
PGM# are at V and OE# is at V .  
IL  
IH  
Byte 0 (A0 = V ) represents the manufacturer code,  
IL  
For programming, the data to be programmed is ap-  
plied 8 bits in parallel to the data pins.  
and Byte 1 (A0 = V ), the device identifier code. Both  
codes have odd parity, with DQ7 as the parity bit.  
IH  
The flowchart in the Programming section of the  
EPROM Products Data Book (Section 5, Figure 5-1)  
shows AMD’s Flashrite algorithm. The Flashrite algo-  
rithm reduces programming time by using a 100 µs pro-  
gramming pulse and by giving each address only as  
many pulses to reliably program the data. After each  
pulse is applied to a given address, the data in that ad-  
dress is verified. If the data does not verify, additional  
pulses are given until it verifies or the maximum pulses  
allowed is reached. This process is repeated while se-  
quencing through each address of the device. This part  
Read Mode  
To obtain data at the device outputs, Chip Enable (CE#)  
and Output Enable (OE#) must be driven low. CE# con-  
trols the power to the device and is typically used to se-  
lect the device. OE# enables the device to output data,  
independent of device selection. Addresses must be  
stable for at least t  
Waveforms section for the timing diagram.  
–t . Refer to the Switching  
ACC OE  
Standby Mode  
The device enters the CMOS standby mode when CE#  
of the algorithm is done at V = 6.25 V to assure that  
CC  
is at V ± 0.3 V. Maximum V current is reduced to  
CC  
CC  
each EPROM bit is programmed to a sufficiently high  
threshold voltage. After the final address is completed,  
100 µA. The device enters the TTL-standby mode  
when CE# is at V . Maximum V current is reduced  
to 1.0 mA. When in either standby mode, the device  
places its outputs in a high-impedance state, indepen-  
dent of the OE# input.  
IH  
CC  
the entire EPROM memory is verified at V  
5.25 V.  
= V  
=
CC  
PP  
Please refer to Section 5 of the EPROM Products Data  
Book for additional programming information and spec-  
ifications.  
Output OR-Tieing  
To accommodate multiple memory connections, a  
two-line control function provides:  
Program Inhibit  
Programming different data to multiple devices in par-  
allel is easily accomplished. Except for CE#, all like in-  
puts of the devices may be common. A TTL low-level  
program pulse applied to one device’s CE# input with  
Low memory power dissipation, and  
Assurance that output bus contention will not occur.  
Am27C010  
5

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