AGR09045E
45 W, 865 MHz—895 MHz, N-Channel E-Mode, Lateral MOSFET
Table 1. Thermal Characteristics
Introduction
Parameter
Sym
Value
Unit
The AGR09045E is a high-voltage, gold-metalized,
laterally diffused metal oxide semiconductor
Thermal Resistance,
Junction to Case:
AGR09045EU
(LDMOS) RF power transistor suitable for cellular
band, code-division multiple access (CDMA), global
system for mobile communication (GSM), enhanced
data for global evolution (EDGE), and time-division
multiple access (TDMA) single and multicarrier class
AB wireless base station amplifier applications. This
device is manufactured on an advanced LDMOS
technology, offering state-of-the-art performance,
reliability, and thermal resistance. Packaged in an
industry-standard CuW package capable of deliver-
ing a minimum output power of 45 W, it is ideally
suited for today's RF power amplifier applications.
R JC
R JC
1.2
1.5
°C/W
°C/W
AGR09045EF
Table 2. Absolute Maximum Ratings*
Parameter
Drain-source Voltage
Gate-source Voltage
Drain Current—Continuous
Total Dissipation at TC = 25 °C:
AGR09045EU
Sym Value Unit
65 Vdc
VGS –0.5, +15 Vdc
VDSS
ID
4.25
Adc
PD
PD
146
117
W
W
AGR09045EF
Derate Above 25 °C:
AGR09045EU
AGR09045EF
Operating Junction Tempera-
ture
—
—
TJ
0.83 W/°C
0.67 W/°C
200
°C
Storage Temperature Range
TSTG –65, +150 °C
AGR09045EU (unflanged)
AGR09045EF (flanged)
* Stresses in excess of the absolute maximum ratings can cause
permanent damage to the device. These are absolute stress rat-
ings only. Functional operation of the device is not implied at
these or any other conditions in excess of those given in the
operational sections of the data sheet. Exposure to absolute
maximum ratings for extended periods can adversely affect
device reliability.
Figure 1. Available Packages
Features
Table 3. ESD Rating*
Typical performance ratings are for IS-95 CDMA,
pilot, sync, paging, traffic codes 8—13:
— Output power (POUT): 10 W.
— Power gain: 20 dB.
AGR09045E
HBM
Minimum (V)
Class
500
50
1B
A
MM
— Efficiency: 28%.
— Adjacent channel power ratio (ACPR) for
30 kHz bandwidth (BW):
(750 kHz offset: –45 dBc)
(1.98 MHz offset: –60 dBc).
— Input return loss: 10 dB.
CDM
1500
4
* Although electrostatic discharge (ESD) protection circuitry has
been designed into this device, proper precautions must be
taken to avoid exposure to ESD and electrical overstress (EOS)
PEAK Devices
during all handling, assembly, and test operations. Agere
employs a human-body model (HBM), a machine model (MM),
and a charged-device model (CDM) qualification requirement in
order to determine ESD-susceptibility limits and protection
design evaluation. ESD voltage thresholds are dependent on the
circuit parameters used in each of the models, as defined by
JEDEC's JESD22-A114B (HBM), JESD22-A115A (MM), and
JESD22-C101A (CDM) standards.
High-reliability, gold-metalization process.
High gain, efficiency, and linearity.
Integrated ESD protection.
Si LDMOS.
Industry-standard packages.
45 W minimum output power.
Caution: MOS devices are susceptible to damage from elec-
trostatic charge. Reasonable precautions in han-
dling and packaging MOS devices should be
observed.