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AGR18060EF PDF预览

AGR18060EF

更新时间: 2024-11-09 06:36:47
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9页 401K
描述
60 W, 1805 MHz-1880 MHz, LDMOS RF Power Transistor

AGR18060EF 数据手册

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AGR18060E  
60 W, 1805 MHz—1880 MHz, LDMOS RF Power Transistor  
Table 1. Thermal Characteristics  
Introduction  
Parameter  
Thermal Resistance,  
Junction to Case:  
AGR18060EU  
Sym  
Value  
Unit  
The AGR18060E is a 60 W, 26 V N-channel laterally  
diffused metal oxide semiconductor (LDMOS)  
RF power field effect transistor (FET) suitable for  
enhanced data for global evolution (EDGE), global  
system for mobile communication (GSM), and single-  
carrier or multicarrier class AB power amplifier appli-  
cations. It is packaged in an industry-standard pack-  
age and is capable of delivering a minimum output  
power of 60 W, which makes it ideally suited for  
today’s wireless base station RF power amplifier  
applications.  
1.00  
1.00  
°C/W  
°C/W  
Rı JC  
Rı JC  
AGR18060EF  
Table 2. Absolute Maximum Ratings*  
Parameter  
Sym Value Unit  
VDSS 65 Vdc  
VGS –0.5, 15 Vdc  
Drain-source Voltage  
Gate-source Voltage  
Total Dissipation at TC = 25 °C:  
AGR18060EU  
PD  
PD  
175  
175  
W
W
AGR18060EF  
Derate Above 25 ˇC:  
AGR18060EU  
AGR18060EF  
TJ  
1.00  
1.00  
200  
W/°C  
W/°C  
°C  
AGR18060EU AGR18060EF  
Figure 1. Available Packages  
Operating Junction Tempera-  
ture  
Storage Temperature Range  
TSTG –65, 150 °C  
Features  
* Stresses in excess of the absolute maximum ratings can cause  
permanent damage to the device. These are absolute stress rat-  
ings only. Functional operation of the device is not implied at  
these or any other conditions in excess of those given in the  
operational sections of the data sheet. Exposure to absolute  
maximum ratings for extended periods can adversely affect  
device reliability.  
Typical EDGE performance:  
1880 MHz, 26 V, IDQ = 500 mA  
— Output power (POUT): 20 W.  
— Power gain: 15 dB.  
— Efficiency: 34%.  
— Modulation spectrum:  
@ ±400 kHz = –62 dBc.  
@ ±600 kHz = –73 dBc.  
— Error vector magnitude (EVM) = 2%.  
Table 3. ESD Rating*  
Minimum (V)  
Class  
AGR18060E  
HBM  
500  
50  
1B  
A
MM  
Typical performance over entire GSM band:  
— P1dB: 60 W typ.  
CDM  
1500  
4
— Power gain: @ P1dB = 14 dB.  
— Efficiency @ P1dB = 52% typical.  
— Return loss: –10 dB.  
* Although electrostatic discharge (ESD) protection circuitry has  
been designed into this device, proper precautions must be  
taken to avoid exposure to ESD and electrical overstress (EOS)  
PEAK Devices  
during all handling, assembly, and test operations.
High-reliability, gold-metalization process.  
employs both a human-body model (HBM) and a charged-device  
model (CDM) qualification requirement in order to determine  
ESD-susceptibility limits and protection design evaluation. ESD  
voltage thresholds are dependent on the circuit parameters used  
in each of the models, as defined by JEDEC's JESD22-A114  
(HBM) and JESD22-C101 (CDM) standards.  
Low hot carrier injection (HCI) induced bias drift  
over 20 years.  
Internally matched.  
Caution: MOS devices are susceptible to damage from elec-  
trostatic charge. Reasonable precautions in han-  
dling and packaging MOS devices should be  
observed.  
High gain, efficiency, and linearity.  
Integrated ESD protection.  
Device can withstand 10:1 voltage standing wave  
ratio (VSWR) at 26 Vdc, 1805 MHz, 60 W continu-  
ous wave (CW) output power.  
Large signal impedance parameters available.  

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