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ADUM4120-1ARIZ-RL PDF预览

ADUM4120-1ARIZ-RL

更新时间: 2022-05-14 22:14:47
品牌 Logo 应用领域
亚德诺 - ADI
页数 文件大小 规格书
17页 308K
描述
Isolated, Precision Gate Drivers with 2 A Output

ADUM4120-1ARIZ-RL 数据手册

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Data Sheet  
ADuM4120/ADuM4120-1  
1k  
Insulation Wear Out  
The lifetime of insulation caused by wear out is determined by  
its thickness, material properties, and the voltage stress applied.  
It is important to verify that the product lifetime is adequate at  
the application working voltage. The working voltage supported  
by an isolator for wear out may not be the same as the working  
voltage supported for tracking. The working voltage applicable  
to tracking is specified in most standards.  
DISTANCE = 1m  
100  
10  
DISTANCE = 100mm  
1
0.1  
DISTANCE = 5mm  
Testing and modeling show that the primary driver of long-  
term degradation is displacement current in the polyimide  
insulation causing incremental damage. The stress on the insulation  
can be broken down into broad categories, such as dc stress, which  
causes very little wear out because there is no displacement  
current, and an ac component time varying voltage stress,  
which causes wear out.  
0.01  
1k  
10k  
100k  
1M  
10M  
100M  
MAGNETIC FIELD FREQUENCY (Hz)  
Figure 25. Maximum Allowable Current for Various Current to  
ADuM4120/ADuM4120-1 Spacings  
The ratings in certification documents are usually based on 60 Hz  
sinusoidal stress because this stress reflects isolation from line  
voltage. However, many practical applications have combinations  
of 60 Hz ac and dc across the barrier as shown in Equation 1.  
Because only the ac portion of the stress causes wear out, the  
equation can be rearranged to solve for the ac rms voltage, as  
shown in Equation 2. For insulation wear out with the polyimide  
materials used in this product, the ac rms voltage determines  
the product lifetime.  
INSULATION LIFETIME  
All insulation structures eventually break down when subjected  
to voltage stress over a sufficiently long period. The rate of  
insulation degradation is dependent on the characteristics of the  
voltage waveform applied across the insulation, as well as on the  
materials and material interfaces.  
Two types of insulation degradation are of primary interest:  
breakdown along surfaces exposed to air and insulation wear  
out. Surface breakdown is the phenomenon of surface tracking  
and the primary determinant of surface creepage requirements  
in system level standards. Insulation wear out is the phenomenon  
where charge injection or displacement currents inside the  
insulation material cause long-term insulation degradation.  
2
V
RMS VAC RMS2 VDC  
(1)  
or  
2
VAC RMS VRMS2 VDC  
(2)  
Surface Tracking  
where:  
Surface tracking is addressed in electrical safety standards by  
setting a minimum surface creepage based on the working  
voltage, the environmental conditions, and the properties of the  
insulation material. Safety agencies perform characterization  
testing on the surface insulation of components that allows the  
components to be categorized in different material groups.  
Lower material group ratings are more resistant to surface  
tracking and therefore can provide adequate lifetime with  
smaller creepage. The minimum creepage for a given working  
voltage and material group is in each system level standard and  
is based on the total rms voltage across the isolation, pollution  
degree, and material group. The material group and creepage  
for the ADuM4120/ADuM4120-1 isolators are shown in Table 4.  
V
V
V
RMS is the total rms working voltage.  
AC RMS is the time varying portion of the working voltage.  
DC is the dc offset of the working voltage.  
Calculation and Use of Parameters Example  
The following is an example that frequently arises in power  
conversion applications. Assume that the line voltage on one  
side of the isolation is 240 V ac rms, and a 400 V dc bus voltage  
is present on the other side of the isolation barrier. The isolator  
material is polyimide. To establish the critical voltages in  
determining the creepage clearance and lifetime of a device,  
see Figure 26 and the following equations.  
Rev. 0 | Page 15 of 17  
 

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