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ADF4002BCPZ-RL7 PDF预览

ADF4002BCPZ-RL7

更新时间: 2024-02-10 08:29:20
品牌 Logo 应用领域
亚德诺 - ADI /
页数 文件大小 规格书
24页 457K
描述
Phase Detector/Frequency Synthesizer

ADF4002BCPZ-RL7 数据手册

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ADF4002  
ABSOLUTE MAXIMUM RATINGS  
TA = 25°C, unless otherwise noted.  
Table 3.  
Stresses above those listed under Absolute Maximum Ratings  
may cause permanent damage to the device. This is a stress  
rating only; functional operation of the device at these or any  
other conditions above those indicated in the operational  
section of this specification is not implied. Exposure to absolute  
maximum rating conditions for extended periods may affect  
device reliability.  
Parameter  
AVDD to GND1  
Rating  
–0.3 V to +3.6 V  
–0.3 V to +0.3 V  
–0.3 V to +5.8 V  
–0.3 V to +5.8 V  
–0.3 V to VDD + 0.3 V  
–0.3 V to VP + 0.3 V  
–0.3 V to VDD + 0.3 V  
AVDD to DVDD  
VP to GND  
VP to AVDD  
Digital I/O Voltage to GND  
Analog I/O Voltage to GND  
REFIN, RFINA, RFINB to GND  
Operating Temperature Range  
Industrial (B Version)  
Storage Temperature Range  
Maximum Junction Temperature  
Lead Temperature, Soldering  
Vapor Phase (60 sec)  
Infrared (15 sec)  
This device is a high performance RF integrated circuit with an  
ESD rating of <2 kV, and it is ESD sensitive. Proper precautions  
should be taken for handling and assembly.  
–40°C to +85°C  
–65°C to +125°C  
150°C  
THERMAL CHARACTERISTICS  
Table 4. Thermal Impedance  
215°C  
220°C  
Package Type  
θJA  
Unit  
°C/W  
°C/W  
Transistor Count  
TSSOP  
LFCSP_VQ  
150.4  
122  
CMOS  
Bipolar  
6425  
303  
1 GND = AGND = DGND = 0 V.  
ESD CAUTION  
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on  
the human body and test equipment and can discharge without detection. Although this product features  
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy  
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance  
degradation or loss of functionality.  
Rev. 0 | Page 5 of 24  
 
 

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