ADC104S101
SNAS284F –FEBRUARY 2005–REVISED MARCH 2013
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ADC104S101 Converter Electrical Characteristics(1)
The following specifications apply for VA = +2.7V to 5.25V, GND = 0V, CL = 50 pF, fSCLK = 8 MHz to 16 MHz,
fSAMPLE = 500 ksps to 1 Msps, unless otherwise noted. Boldface limits apply for TA = TMIN to TMAX; all other limits TA = 25°C.
Parameter
Test Conditions
Typical
Limits(2)
Units
STATIC CONVERTER CHARACTERISTICS
Resolution with No Missing Codes
10
Bits
+0.4
−0.1
+0.7
−0.5
+0.6
−0.6
±0.6
±0.6
±0.7
±0.5
LSB (max)
LSB (min)
LSB (max)
LSB (min)
LSB (max)
LSB (max)
LSB (max)
LSB (max)
INL
Integral Non-Linearity
+0.26
−0.16
+0.19
0.02
DNL
Differential Non-Linearity
VOFF
OEM
FSE
Offset Error
Channel to Channel Offset Error Match
Full Scale Error
−0.15
0.02
FSEM
Channel to Channel Full Scale Error Match
DYNAMIC CONVERTER CHARACTERISTICS
VA = +2.7V to 5.25V
fIN = 40.3 kHz, −0.02 dBFS
SINAD
SNR
Signal-to-Noise Plus Distortion Ratio
Signal-to-Noise Ratio
61.6
61.7
−82
83
61
61.3
−72
75
dB (min)
dB (min)
dB (max)
dB (min)
VA = +2.7V to 5.25V
fIN = 40.3 kHz, −0.02 dBFS
VA = +2.7V to 5.25V
fIN = 40.3 kHz, −0.02 dBFS
THD
Total Harmonic Distortion
VA = +2.7V to 5.25V
fIN = 40.3 kHz, −0.02 dBFS
SFDR
ENOB
Spurious-Free Dynamic Range
VA = +2.7V to 5.25V
fIN = 40.3 kHz, −0.02 dBFS
Effective Number of Bits
9.9
−78
−82
9.8
Bits (min)
dB
Channel-to-Channel Crosstalk
VA = +5.25V, fIN = 40.3 kHz
Intermodulation Distortion, Second Order
Terms
VA = +5.25V
fa = 40.161 kHz, fb = 41.015 kHz
dB
IMD
Intermodulation Distortion, Third Order
Terms
VA = +5.25V
fa = 40.161 kHz, fb = 41.015 kHz
−81
dB
VA = +5V
VA = +3V
11
8
MHz
MHz
FPBW
-3 dB Full Power Bandwidth
ANALOG INPUT CHARACTERISTICS
VIN
Input Range
0 to VA
V
µA (max)
pF
IDCL
DC Leakage Current
±1
Track Mode
Hold Mode
33
3
CINA
Input Capacitance
pF
DIGITAL INPUT CHARACTERISTICS
VA = +5.25V
VA = +3.6V
2.4
2.1
0.8
±10
4
V (min)
V (min)
VIH
Input High Voltage
VIL
Input Low Voltage
Input Current
V (max)
µA (max)
pF (max)
IIN
VIN = 0V or VA
±0.2
2
CIND
Digital Input Capacitance
(1) Min/max specification limits are ensured by design, test, or statistical analysis.
(2) Tested limits are ensured to TI's AOQL (Average Outgoing Quality Level).
4
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