ADC104S101
SNAS284F –FEBRUARY 2005–REVISED MARCH 2013
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ADC104S101 Timing Specifications
The following specifications apply for VA = +2.7V to 5.25V, GND = 0V, CL = 50 pF, fSCLK = 8 MHz to 16 MHz, fSAMPLE = 500
ksps to 1 Msps, Boldface limits apply for TA = TMIN to TMAX: all other limits TA = 25°C.
Parameter
Test Conditions
VA = +3.0V
Typical
−3.5
−0.5
+4.5
+1.5
+4
Limits(1)
10
Units
tCSU
tCLH
tEN
Setup Time SCLK High to CS Falling Edge
See(2)
See(2)
ns (min)
VA = +5.0V
VA = +3.0V
VA = +5.0V
VA = +3.0V
VA = +5.0V
VA = +3.0V
VA = +5.0V
Hold time SCLK Low to CS Falling Edge
Delay from CS Until DOUT active
10
30
30
ns (min)
ns (max)
ns (max)
+2
+16.5
+15
+3
tACC
Data Access Time after SCLK Falling Edge
tSU
tH
tCH
tCL
Data Setup Time Prior to SCLK Rising Edge
Data Valid SCLK Hold Time
SCLK High Pulse Width
10
10
ns (min)
ns (min)
+3
0.5 x tSCLK 0.3 x tSCLK ns (min)
SCLK Low Pulse Width
0.5 x tSCLK 0.3 x tSCLK ns (min)
VA = +3.0V
VA = +5.0V
VA = +3.0V
VA = +5.0V
1.7
1.2
Output Falling
Output Rising
tDIS
CS Rising Edge to DOUT High-Impedance
20
ns (max)
1.0
1.0
(1) Tested limits are ensured to TI's AOQL (Average Outgoing Quality Level).
(2) Clock may be either high or low when CS is asserted as long as setup and hold times tCSU and tCLH are strictly observed.
6
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