ADC10662, ADC10664
www.ti.com
SNAS076E –JUNE 1999–REVISED MARCH 2013
ADC10662/ADC10664 10-Bit 360 ns A/D Converter with Input Multiplexer and Sample/Hold
Check for Samples: ADC10662, ADC10664
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FEATURES
DESCRIPTION
NOTE: The ADC10662 is obsolete. It is described
here for reference only.
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Built-In Sample-and-Hold
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Single +5V Supply
Using an innovative, patented multistep (U.S. Patent
Number 4918449) conversion technique, these 10-bit
CMOS analog-to-digital converters offer sub-
No External Clock Required
Speed Adjust Pin for Faster Conversions
microsecond conversion times yet dissipating
maximum of only 235 mW. These converters perform
10-bit conversions in two lower-resolution “flashes”,
a
APPLICATIONS
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Digital Signal Processor Front Ends
Instrumentation
yielding
a
fast A/D without the cost, power
consumption, and other problems associated with
true flash approaches. In addition to standard static
performance specifications (Linearity, Full-Scale
Error, etc.), dynamic performance (THD, S/N) is
ensured.
Disk Drives
Mobile Telecommunications
KEY SPECIFICATIONS
The analog input voltage ADC is sampled and held
by an internal sampling circuit. Input signals at
frequencies from DC to over 250 kHz can therefore
be digitized accurately without the need for an
external sample-and-hold circuit.
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Conversion Time 360 ns (Typical)
Max. Sampling Rate: 1.5 MHz (Min)
Low Power Consumption 235 mW (Max)
Total Harmonic Distortion (50 kHz): −60 dB
(Max)
Connecting an external resistor between the “speed-
up” pin and ground reduces the typical conversion
time to as little as 360 ns for a small linearity
sacrifice.
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No Missing Codes Over Temperature
For ease of interface to microprocessors, the
ADC10662 and ADC10664 have been designed to
appear as a memory location or I/O port without the
need for external interface logic.
Simplified Block Diagram
*ADC10664 Only
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PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 1999–2013, Texas Instruments Incorporated