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AD677JR-REEL

更新时间: 2024-02-14 13:26:04
品牌 Logo 应用领域
罗彻斯特 - ROCHESTER 信息通信管理光电二极管转换器
页数 文件大小 规格书
17页 1110K
描述
1-CH 16-BIT SUCCESSIVE APPROXIMATION ADC, SERIAL ACCESS, PDSO28, PLASTIC, SOIC-28

AD677JR-REEL 技术参数

是否无铅: 含铅是否Rohs认证: 不符合
生命周期:Active零件包装代码:SOIC
包装说明:SOP,针数:28
Reach Compliance Code:unknown风险等级:5.66
最大模拟输入电压:10 V最小模拟输入电压:-10 V
转换器类型:ADC, SUCCESSIVE APPROXIMATIONJESD-30 代码:R-PDSO-G28
JESD-609代码:e0长度:17.9 mm
湿度敏感等级:5标称负供电电压:-12 V
模拟输入通道数量:1位数:16
功能数量:1端子数量:28
最高工作温度:70 °C最低工作温度:
输出位码:BINARY输出格式:SERIAL
封装主体材料:PLASTIC/EPOXY封装代码:SOP
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
峰值回流温度(摄氏度):240采样速率:0.1 MHz
采样并保持/跟踪并保持:SAMPLE座面最大高度:2.65 mm
标称供电电压:12 V表面贴装:YES
技术:BICMOS温度等级:COMMERCIAL
端子面层:TIN LEAD端子形式:GULL WING
端子节距:1.27 mm端子位置:DUAL
处于峰值回流温度下的最长时间:30宽度:7.5 mm
Base Number Matches:1

AD677JR-REEL 数据手册

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AD677  
In most applications, it is sufficient to calibrate the AD677 only  
upon power-up, in which case care should be taken that the  
power supplies and voltage reference have stabilized first. If  
calibration is not performed, the AD677 may come up in an un-  
known state, or performance could degrade to as low as 10 bits.  
FUNCTIONAL DESCRIPTION  
The AD677 is a multipurpose 16-bit analog-to-digital converter  
and includes circuitry which performs an input sample/hold  
function, ground sense, and autocalibration. These functions  
are segmented onto two monolithic chips—an analog signal pro-  
cessor and a digital controller. Both chips are contained within  
the AD677 package.  
CONVERSION CONTROL  
The AD677 is controlled by two signals: SAMPLE and CLK,  
as shown in Figure 2. It is assumed that the part has been cali-  
brated and the digital I/O pins have the levels shown at the start  
of the timing diagram.  
The AD677 employs a successive-approximation technique to  
determine the value of the analog input voltage. However, in-  
stead of the traditional laser-trimmed resistor-ladder approach,  
this device uses a capacitor-array, charge redistribution tech-  
nique. Binary-weighted capacitors subdivide the input sample to  
perform the actual analog-to-digital conversion. The capacitor  
array eliminates variation in the linearity of the device due to  
temperature-induced mismatches of resistor values. Since a  
capacitor array is used to perform the data conversions, the  
sample/hold function is included without the need for additional  
external circuitry.  
A conversion consists of an input acquisition followed by 17  
clock pulses which execute the 16-bit internal successive ap-  
proximation routine. The analog input is acquired by taking the  
SAMPLE line HIGH for a minimum sampling time of tS. The  
actual sample taken is the voltage present on VIN one aperture  
delay after the SAMPLE line is brought LOW, assuming the  
previous conversion has completed (signified by BUSY going  
LOW). Care should be taken to ensure that this negative edge is  
well defined and jitter free in ac applications to reduce the un-  
certainty (noise) in signal acquisition. With SAMPLE going  
LOW, the AD677 commits itself to the conversion—the input  
at VIN is disconnected from the internal capacitor array, BUSY  
goes HIGH, and the SAMPLE input will be ignored until the  
conversion is completed (when BUSY goes LOW). SAMPLE  
must be held LOW for a minimum period of time tSL. A period  
of time tFCD after bringing SAMPLE LOW, the 17 CLK cycles  
are applied; CLK pulses that start before this period of time are  
ignored. BUSY goes HIGH tSB after SAMPLE goes LOW, sig-  
nifying that a conversion is in process, and remains HIGH until  
the conversion is completed. As indicated in Figure 2, the twos  
complement output data is presented MSB first. This data may  
be captured with the rising edge of SCLK or the falling edge of  
CLK, beginning with pulse #2. The AD677 will ignore CLK  
after BUSY has gone LOW and SDATA or SCLK will not  
change until a new sample is acquired.  
Initial errors in capacitor matching are eliminated by an  
autocalibration circuit within the AD677. This circuit employs  
an on-chip microcontroller and a calibration DAC to measure  
and compensate capacitor mismatch errors. As each error is  
determined, its value is stored in on-chip memory (RAM).  
Subsequent conversions use these RAM values to improve con-  
version accuracy. The autocalibration routine may be invoked  
at any time. Autocalibration insures high performance while  
eliminating the need for any user adjustments and is described  
in detail below.  
The microcontroller controls all of the various functions within  
the AD677. These include the actual successive approximation  
algorithm, the autocalibration routine, the sample/hold opera-  
tion, and the internal output data latch.  
AUTO CALIBRATION  
The AD677 achieves rated performance without the need for  
user trims or adjustments. This is accomplished through the use  
of on-chip autocalibration.  
CONTINUOUS CONVERSION  
For maximum throughput rate, the AD677 can be operated in a  
continuous convert mode. This is accomplished by utilizing the  
fact that SAMPLE will no longer be ignored after BUSY goes  
LOW, so an acquisition may be initiated even during the HIGH  
time of the 17th CLK pulse for maximum throughput rate  
while enabling full settling of the sample/hold circuitry. If  
SAMPLE is already HIGH during the rising edge of the 17th  
CLK, then an acquisition is immediately initiated approxi-  
mately 100 ns after the rising edge of the 17th clock pulse.  
In the autocalibration sequence, sample/hold offset is nulled by  
internally connecting the input circuit to the ground sense cir-  
cuit. The resulting offset voltage is measured and stored in  
RAM for later use. Next, the capacitor representing the most  
significant bit (MSB) is charged to the reference voltage. This  
charge is then transferred to a capacitor of equal size (composed  
of the sum of the remaining lower weight bits). The voltage that  
results represents the amount of capacitor mismatch. A calibra-  
tion digital-to-analog converter (DAC) adds an appropriate  
value of error correction voltage to cancel this mismatch. This  
correction factor is also stored in RAM. This process is repeated  
for each of the eight remaining capacitors representing the top  
nine bits. The accumulated values in RAM are then used during  
subsequent conversions to adjust conversion results accordingly.  
Care must be taken to adhere to the minimum/maximum tim-  
ing requirements in order to preserve conversion accuracy.  
GENERAL CONVERSION GUIDELINES  
During signal acquisition and conversion, care should be taken  
with the logic inputs to avoid digital feedthrough noise. It is  
possible to run CLK continuously, even during the sample  
period. However, CLK edges during the sampling period, and  
especially when SAMPLE goes LOW, may inject noise into the  
sampling process. The AD677 is tested with no CLK cycles  
during the sampling period. The BUSY signal can be used to  
prevent the clock from running during acquisition, as illustrated  
As shown in Figure 1, when CAL is taken HIGH the AD677  
internal circuitry is reset, the BUSY pin is driven HIGH, and  
the ADC prepares for calibration. This is an asynchronous hard-  
ware reset and will interrupt any conversion or calibration cur-  
rently in progress. Actual calibration begins when CAL is taken  
LOW and completes in 85,532 clock cycles, indicated by BUSY  
going LOW. During calibration, it is preferable for SAMPLE to  
be held LOW. If SAMPLE is HIGH, diagnostic data will appear  
on SDATA. This data is of no value to the user.  
–8–  
REV. A  

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