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AD6624AS/PCB PDF预览

AD6624AS/PCB

更新时间: 2024-01-24 01:24:58
品牌 Logo 应用领域
亚德诺 - ADI /
页数 文件大小 规格书
40页 611K
描述
Four-Channel, 100 MSPS Digital Receive Signal Processor (RSP)

AD6624AS/PCB 技术参数

生命周期:Obsolete零件包装代码:QFP
包装说明:FQFP,针数:128
Reach Compliance Code:unknownECCN代码:5A991.B.1
HTS代码:8542.31.00.01风险等级:5.82
JESD-30 代码:R-PQFP-G128长度:20 mm
功能数量:1端子数量:128
最高工作温度:85 °C最低工作温度:-40 °C
封装主体材料:PLASTIC/EPOXY封装代码:FQFP
封装形状:RECTANGULAR封装形式:FLATPACK, FINE PITCH
认证状态:Not Qualified座面最大高度:3.4 mm
标称供电电压:2.5 V表面贴装:YES
技术:CMOS电信集成电路类型:TELECOM CIRCUIT
温度等级:INDUSTRIAL端子形式:GULL WING
端子节距:0.5 mm端子位置:QUAD
宽度:14 mmBase Number Matches:1

AD6624AS/PCB 数据手册

 浏览型号AD6624AS/PCB的Datasheet PDF文件第34页浏览型号AD6624AS/PCB的Datasheet PDF文件第35页浏览型号AD6624AS/PCB的Datasheet PDF文件第36页浏览型号AD6624AS/PCB的Datasheet PDF文件第38页浏览型号AD6624AS/PCB的Datasheet PDF文件第39页浏览型号AD6624AS/PCB的Datasheet PDF文件第40页 
AD6624A  
JTAG BOUNDARY SCAN  
SAMPLE/PRELOAD (3b010) Allows the IC to remain in  
normal functional mode and selects the boundary-scan register  
to be connected between TDI and TDO. The boundary-scan  
register can be accessed by a scan operation to take a sample of  
the functional data entering and leaving the IC. Also, test  
data can be preloaded into the boundary scan register before  
an EXTEST instruction.  
The AD6624A supports a subset of IEEE Standard 1149.1 specifi-  
cations. For additional details of the standard, please see IEEE  
Standard Test Access Port and Boundary-Scan Architecture,”  
IEEE-1149 publication from IEEE.  
The AD6624A has five pins associated with the JTAG interface.  
These pins are used to access the on-chip Test Access Port and  
are listed in the table below. All input JTAG pins are pull-up,  
except for TCLK which has a pull-down.  
HIGHZ (3b011) Sets all outputs to high impedance state.  
Selects the 1-bit bypass register to be connected between  
TDI and TDO.  
Table XIV. Boundary Scan Test Pins  
CLAMP (3b100) Sets the outputs of the IC to logic levels  
determined by the boundary-scan register and selects the 1-bit  
bypass register to be connected between TDI and TDO. Before  
this instruction, boundary-scan data can be preloaded with  
the SAMPLE/PRELOAD instruction.  
Name  
Pin Number  
Description  
TRST  
TCLK  
TMS  
TDI  
67  
68  
69  
72  
70  
Test Access Port Reset  
Test Clock  
Test Access Port Mode Select  
Test Data Input  
Test Data Output  
BYPASS (3b111) Allows the IC to remain in normal functional  
mode and selects 1-bit bypass register between TDI and TDO.  
During this instruction, serial data is transferred from TDI to  
TDO without affecting operation of the IC.  
TDO  
The AD6624A supports the op codes as shown below. These  
instructions set the mode of the JTAG interface.Address 02 is  
the dwell time for input channel A. This sets the  
INTERNAL WRITE ACCESS  
Up to 20 bits of data (as needed) can be written by the process  
described below. Any high order bytes that are needed are writ-  
ten to the corresponding data registers defined in the external  
3-bit address space. The least significant byte is then written to  
DR0 at address (000). When a write to DR0 is detected, the  
internal microprocessor port state machine then moves the data  
in DR2-DR0 to the internal address pointed to by the address in  
the LAR and AMR.  
Table XV. Boundary Scan Op Codes  
Instruction  
Op Code  
IDCODE  
BYPASS  
SAMPLE/PRELOAD  
EXTEST  
HIGHZ  
001  
111  
010  
000  
011  
100  
Write Pseudocode  
void write_micro(ext_address, int data);  
CLAMP  
main();  
{
The Vendor Identification Code can be accessed through the  
IDCODE instruction and has the following format.  
/* This code shows the programming of the NCO phase offset  
register using the write_micro function as defined above. The  
variable address is the External Address A[2:0] and data is the  
value to be placed in the external interface register.  
Table XVI. Vendor ID Code  
MSB  
Version  
Part  
Number  
Manufacturing  
ID #  
LSB  
Mandatory  
Internal Address = 0x087  
0000  
0010  
0111  
1000  
1100  
000 1110 0101  
1
*/  
// holding registers for NCO phase byte wide access data  
int d1, d0;  
// NCO frequency word (16-bits wide)  
NCO_PHASE = 0xCBEF;  
A BSDL file for this device is available; please contact Analog  
Devices, Inc. for more information.  
// write ACR  
write_micro(7, 0x03);  
EXTEST (3b000) Places the IC into an external boundary-test  
mode and selects the boundary-scan register to be connected  
between TDI and TDO. During this, the boundary-scan regis-  
ter is accessed to drive test data off-chip via boundary outputs  
and receive test data off-chip from boundary inputs.  
// write CAR  
write_micro(6, 0x03);  
// write DR1 with D[15:8]  
d1 = (NCO_PHASE & 0xFF00) >> 8;  
write_micro(1, d1);  
IDCODE (3b001) Allows the IC to remain in its functional  
mode and selects device ID register to be connected between  
TDI and TDO. Accessing the ID register does not interfere  
with the operation of the IC.  
// write DR0 with D[7:0]  
// On this write all data is transferred to the internal address  
d0 = NCO_FREQ & 0xFF;  
write_micro(0, d0);  
} // end of main  
REV. 0  
–37–  

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