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ACPM-5011

更新时间: 2024-01-18 15:25:40
品牌 Logo 应用领域
安华高科 - AVAGO LTE
页数 文件大小 规格书
13页 977K
描述
UMTS/LTE Band11 Band21 (1427.9 - 1462.9 MHz) 3 x 3 mm Power Amplifier Module

ACPM-5011 技术参数

是否Rohs认证:符合生命周期:Obsolete
包装说明:SOLCC10,.11,24Reach Compliance Code:compliant
ECCN代码:5A991.GHTS代码:8542.33.00.01
风险等级:5.71Is Samacsys:N
其他特性:CMOS COMPATIBLE特性阻抗:50 Ω
构造:COMPONENT增益:8 dB
最大输入功率 (CW):10 dBm安装特点:SURFACE MOUNT
功能数量:1端子数量:10
最大工作频率:1462.9 MHz最小工作频率:1427.9 MHz
最高工作温度:90 °C最低工作温度:-20 °C
封装主体材料:PLASTIC/EPOXY封装等效代码:SOLCC10,.11,24
电源:3.4 V射频/微波设备类型:NARROW BAND LOW POWER
子类别:RF/Microwave Amplifiers最大压摆率:490 mA
表面贴装:YES最大电压驻波比:2
Base Number Matches:1

ACPM-5011 数据手册

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Storage Condition  
Baking of Populated Boards  
Packages described in this document must be stored Some SMD packages and board materials are not able  
in sealed moisture barrier, antistatic bags. Shelf life in a  
sealed moisture barrier bag is 12 months at <40° C and  
90% relative humidity (RH) J-STD-033 p.7.  
to withstand long duration bakes at 125° C. Examples  
of this are some FR-4 materials, which cannot withstand  
a 24 hr bake at 125° C. Batteries and electrolytic capaci-  
tors are also temperature sensitive. With component and  
board temperature restrictions in mind, choose a bake  
temperature from Table 4-1 in J-STD 033; then determine  
the appropriate bake duration based on the component  
to be removed. For additional considerations see IPC-7711  
andIPC-7721.  
Out-of-Bag Time Duration  
After unpacking the device must be soldered to the PCB  
within 168 hours as listed in the J-STD-020B p.11 with  
factory conditions <30° C and 60% RH.  
Baking  
Derating due to Factory Environmental Conditions  
It is not necessary to re-bake the part if both conditions  
(storage conditions and out-of bag conditions) have been  
satisfied. Baking must be done if at least one of the con-  
ditions above have not been satisfied. The baking condi-  
tions are 125° C for 12 hours J-STD-033 p.8.  
Factory floor life exposures for SMD packages removed  
from the dry bags will be a function of the ambient envi-  
ronmental conditions. A safe, yet conservative, handling  
approach is to expose the SMD packages only up to the  
maximum time limits for each moisture sensitivity level  
as shown in next table. This approach, however, does not  
work if the factory humidity or temperature is greater  
than the testing conditions of 30° C/60% RH. A solution  
for addressing this problem is to derate the exposure  
times based on the knowledge of moisture diffusion in  
the component package materials ref. JESD22-A120).  
Recommended equivalent total floor life exposures can  
be estimated for a range of humidities and temperatures  
based on the nominal plastic thickness for each device.  
CAUTION  
Tape and reel materials typically cannot be baked at the  
temperature described above. If out-of-bag exposure  
time is exceeded, parts must be baked for a longer time  
at low temperatures, or the parts must be de-reeled,  
de-taped, re-baked and then put back on tape and reel.  
(See moisture sensitive warning label on each shipping  
bag for information of baking).  
Table on next page lists equivalent derated floor lives for  
humidities ranging from 20-90% RH for three tempera-  
ture, 20° C, 25° C, and 30° C.  
Board Rework  
Component Removal, Rework and Remount  
If a component is to be removed from the board, it is  
recommended that localized heating be used and the  
maximum body temperatures of any surface mount  
component on the board not exceed 200° C. This method  
will minimize moisture related component damage. If any  
component temperature exceeds 200° C, the board must  
be baked dry per 4-2 prior to rework and/or component  
removal. Component temperatures shall be measured at  
the top center of the package body. Any SMD packages  
that have not exceeded their floor life can be exposed to  
a maximum body temperature as high as their specified  
maximum reflow temperature.  
Table on next page is applicable to SMDs molded  
with novolac, biphenyl or multifunctional epoxy mold  
compounds. The following assumptions were used in cal-  
culating this table:  
1. ActivationEnergyfordiffusion=0.35eV(smallestknown  
value).  
2. For ≤60% RH, use Diffusivity = 0.121exp (-0.35eV/kT)  
2
mm /s (this used smallest known Diffusivity @ 30° C).  
3. For >60% RH, use Diffusivity = 1.320exp (-0.35eV/kT)  
2
mm /s (this used largest known Diffusivity @ 30° C).  
Removal for Failure Analysis  
Notfollowingtheaboverequirementsmaycausemoisture/  
reflow damage that could hinder or completely prevent  
the determination of the original failure mechanism.  
12  

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