Datasheet > AA0603DK-071R5L

AA0603DK-071R5L

更新时间： 2022-12-29 20:21:38

品牌	Logo	应用领域
国巨 - YAGEO		/
页数	文件大小	规格书
10页	522K
描述
ANTI-SULFURATED CHIP RESISTORS AUTOMOTIVE GRADE

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数据手册

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AA0603DK-071R5L 数据手册

Product specification

SERIES

0201 to 2512

Chip Resistor Surface Mount

TESTS AND REQUIREMENTS

Table 4 Test condition, procedure and requirements

TEST

TEST METHOD

PROCEDURE

REQUIREMENTS

AEC-Q200 Test 3

High Temperature

Exposure

1,000 hours at T_A= 155 °C, unpowered

±(1.0%+0.05Ω)

MIL-STD-202 Method 108

<50 mΩ for Jumper

AEC-Q200 Test 6

Moisture

Resistance

Each temperature / humidity cycle is defined at

8 hours (method 106F), 3 cycles / 24 hours for

10d. with 25 °C / 65 °C 95% R.H, without steps

7a & 7b, unpowered

±(0.5%+0.05Ω) for D/F tol.

±(2.0%+0.05Ω) for J tol.

<100 mΩ for Jumper

MIL-STD-202 Method 106

Parts mounted on test-boards, without

condensation on parts

AEC-Q200 Test 7

Biased

Humidity

1,000 hours; 85 °C / 85% RH

10% of operating power

±(3.0%+0.05Ω)

MIL-STD-202 Method 103

<100 mΩ for Jumper

Measurement at 24±4 hours after test conclusion.

AEC-Q200 Test 8

Operational Life

1,000 hours at 125 °C, derated voltage applied for ±(1.0%+0.05Ω)

1.5 hours on, 0.5 hour off, still-air required

MIL-STD-202 Method 108

<100 mΩ for Jumper

AEC-Q200 Test 15

Resistance to

Soldering Heat

Condition B, no pre-heat of samples

±(0.5%+0.05Ω) for D/F tol.

±(1.0%+0.05Ω) for J tol.

<50 mΩ for Jumper

MIL-STD-202 Method 210

Lead-free solder, 260± 5 °C, 10±1 seconds

immersion time

Procedure 2 for SMD: devices fluxed and

cleaned with isopropanol

No visible damage

AEC-Q200 Test 16

Thermal Shock

-55/+125 °C

±(1.0%+0.05Ω)

MIL-STD-202 Method 107

Number of cycles is 300. Devices mounted

<50 mΩ for Jumper

Maximum transfer time is 20 seconds.

Dwell time is 15 minutes. Air – Air

AEC-Q200 Test 17

AEC-Q200-002

ESD

1 pos. + 1 neg. discharges

0201: 500V

±(3.0%+0.05Ω)

<50 mΩ for Jumper

0402/0603: 1KV

0805 and above: 2KV

www.yageo.com

Dec. 08, 2015 V.3

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