Precision Hall-Effect Angle Sensor IC
with I2C, SPI, and SENT Interfaces
A1335
OPERATING CHARACTERISTICS (continued): Valid throughout full operating voltage and ambient temperature ranges,
unless otherwise specified
Characteristic
Angle Characteristics
Output7
Symbol
Test Conditions
Min.
Typ.1
Max.
Unit2
RESANGLE
–
–
–
–
12
10.8
12
–
–
–
–
bit
bits
bits
µs
B = 300 G, TA = 25ºC, ORATE = 0
B ≥ 700 G, TA = 25ºC, ORATE = 0
ORATE = 0
Effective resolution8
Angle Refresh Rate9
Response Time10
tANG
32
All linearization and computations disabled, see
Figure 1
tRESPONSE
–
–
60
±0.5
±0.2
–
–
–
µs
TA = 25°C, ideal magnet alignment, B = 300 G,
target rpm = 0, no linearization
degrees
degrees
degrees
degrees
degrees
degrees
TA = 25°C, ideal magnet alignment, B = 900 G,
target rpm = 0, no linearization
–
–
Angle Error11
ERRANG
TA = 150°C, ideal magnet alignment, B = 300 G,
target rpm = 0, no linearization
–1.3
–
+1.3
–
TA = 150°C, ideal magnet alignment, B = 900 G,
target rpm = 0, no linearization
±0.3
0.2
TA = 25°C, 50 samples, B = 300 G, no internal
filtering
–
–
Angle Noise11, 12
NANG
TA = 150°C, 50 samples, B = 300 G, no internal
filtering
–
0.27
–
TA = 150°C, B = 300 G
TA = –40°C, B = 300 G
–1.4
–
1.4
–
degrees
degrees
ANGLEDRIFT
Temperature Drift
±1.2
±0.5
B = 300 G, typical maximum drift observed after
AEC Q100 qualification testing
ANGLEDRIFT-
Angle Drift Over Lifetime
–
–
degrees
LIFE
1 Typical data is at TA = 25°C and VCC = 5 V and it is for design information only.
2 1 G (gauss) = 0.1 mT (millitesla).
3 Parameters for this characteristic are determined by design. They are not measured at
final test.
4 End user can customize what power-on tests are conducted at each power-on that
causes a range of power-on times. For more information, see the description
of the CFG register.
5 During the power-on phase, the A1335 SPI transactions are not guaranteed.
6 The A1335 operates in Magnetic fields lower than 300 G, but with reduced accuracy
and resolution.
7 RESANGLE represents the number of bits of data available for reading from the die
registers.
8 Effective Resolution is calculated using the formula below:
Position 1
Position 2
Magnet
Position
t
50
Response Time
log2 (360) - log2
l
( )
l = 1
where σ is the Standard Deviation based on thirty measurements taken at each of the
32 angular positions, I = 11.25, 22.5, … 360.
9 The rate at which a new angle reading is ready. This value varies with the ORATE
selection.
Output 1
Output 2
Sensor
Output
10 This value assumes no post-processing and is the response time to read the magnetic
position with no further computations. Actual response time is dependent on
EEPROM settings. Settings related to filter design, signal path computations, and
linearization will increase the response time.
11 Error and noise values are with no further signal processing. Angle Error can be cor-
rected with linearization algorithm, and Angle Noise can be reduced with
internal filtering and slower Angle Refresh Rate value.
t
Definition of Response Time
12 One sigma value at 300 G. Operation with a larger magnetic field results in improved
noise performance. For 600 G operation, noise reduced by 40-50% vs. 300 G.
13 Parameter is tested at wafer probe only.
Allegro MicroSystems, LLC
115 Northeast Cutoff
7
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
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