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9085401HXA PDF预览

9085401HXA

更新时间: 2024-11-21 12:53:27
品牌 Logo 应用领域
安华高科 - AVAGO 光电
页数 文件大小 规格书
13页 190K
描述
Hermetically Sealed, Tansistor Output Optocouplers for Analog and Digital Applications

9085401HXA 数据手册

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4N55*, 5962-87679, HCPL-553X, HCPL-653X,  
HCPL-257K, HCPL-655X, 5962-90854, HCPL-550X  
Hermetically Sealed, Transistor Output Optocouplers  
for Analog and Digital Applications  
Data Sheet  
*See matrix for available extensions.  
Description  
Features  
Theseunitsaresingle,dualandquadchannel,hermetically Dual Marked with Device Part Number and DLA  
sealedoptocouplers.Theproductsarecapableofoperation  
and storage over the full military temperature range and  
can be purchased as either standard product or with full  
MIL-PRF-38534 Class Level H or K testing or from the ap-  
Drawing Number  
ManufacturedandTestedonaMIL-PRF-38534Certified  
Line  
propriateDLADrawing. Alldevicesaremanufacturedand QML-38534, Class H and K  
tested on a MIL-PRF-38534 certified line and are included  
in the DLA Qualified Manufacturers List QML-38534 for  
Hybrid Microcircuits.  
Five Hermetically Sealed Package Configurations  
Performance Guaranteed over Full Military  
Temperature Range: -55°C to +125°C  
High Speed: Typically 400 kBit/s  
9 MHz Bandwidth  
Applications  
Military and Space  
Open Collector Output  
High Reliability Systems  
Vehicle Command, Control, Life Critical Systems  
Line Receivers  
2-18 Volt V Range  
CC  
1500 Vdc Withstand Test Voltage  
High Radiation Immunity  
6N135, 6N136, HCPL-2530/2531,  
Function Compatibility  
Switching Power Supply  
Voltage Level Shifting  
Analog Signal Ground Isolation  
(see Figures 7, 8, and 13)  
Reliability Data  
Isolated Input Line Receiver  
Isolated Output Line Driver  
Logic Ground Isolation  
Harsh Industrial Environments  
Isolation for Test Equipment Systems  
The connection of a 0.1 μF bypass capacitor between V and GND is recommended.  
CC  
CAUTION: It is advised that normal static precautions be taken in handling and assembly  
of this component to prevent damage and/or degradation which may be induced by ESD.  

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